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Display of 10 of 398 results for the area: Physik.

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(995.6 KiB)

Automatic etch pit density analysis in multicrystalline silicon

Fleck, Martin; Hahn, Giso (2020) - Journal article
Published in: Computational Materials Science ; 183 (2020). - 109886. - Elsevier. - ISSN 0927-0256. - eISSN 1879-0801
(980.2 KiB)

Correlation between the optical bandgap and the monohydride bond density of hydrogenated amorphous silicon

Steffens, Jonathan; Rinder, Johannes; Hahn, Giso; Terheiden, Barbara (2020) - Journal article
Published in: Journal of Non-Crystalline Solids: X ; 5 (2020). - 100044. - Elsevier. - ISSN 2590-1591. - eISSN 2590-1591
Influence of the Carbon Concentration on (p) Poly-SiC_x Layer Properties With Focus on Parasitic Absorption in Front Side Poly-SiC_x/SiO_x Passivating Contacts of Solar Cells

Steffens, Jonathan; Weit, Swetlana; Rinder, Johannes; Glatthaar, Raphael; Möller, Sören; Hahn, Giso; Terheiden, Barbara (2020) - Journal article
Published in: IEEE Journal of Photovoltaics ; 2020. - Institute of Electrical and Electronics Engineers (IEEE). - ISSN 2156-3381. - eISSN 2156-3403
(2.6 MiB)

Silicon Nitride Deposition : Impact on Lifetime and Light-Induced Degradation at Elevated Temperature in Multicrystalline Silicon

Lindroos, Jeanette; Zuschlag, Annika; Skorka, Daniel; Hahn, Giso (2020) - Journal article
Published in: IEEE Journal of Photovoltaics ; 10 (2020), 1. - pp. 8-18. - Institute of Electrical and Electronics Engineers (IEEE). - ISSN 2156-3381. - eISSN 2156-3403
(886 KiB)

Influencing Light and Elevated Temperature Induced Degradation and Surface-Related Degradation Kinetics in Float-Zone Silicon by Varying the Initial Sample State

Hammann, Benjamin; Engelhardt, Josh; Sperber, David; Herguth, Axel; Hahn, Giso (2020) - Journal article
Published in: IEEE Journal of Photovoltaics ; 10 (2020), 1. - pp. 85-93. - Institute of Electrical and Electronics Engineers (IEEE). - ISSN 2156-3381. - eISSN 2156-3403
(912 KiB)

Upgrade technologies for silicon photovoltaics : Part I: industrial solution to minimize the negative impact of light induced degradation

Pernau, Thomas; Derricks, Christian; Hahn, Giso; Helmich, Lailah; Herguth, Axel; Schmidt, Jan; Walter, Dominic (2020) - Contribution to a conference collection
Published in: 37th European Photovoltaic Solar Energy Conference and Exhibition (EUPVSEC) : Proceedings. - München : WIP, 2020. - pp. 414-417. - eISSN 2196-100X. - ISBN 3-936338-73-6
(755.1 KiB)

Reducing LeTID with an Adjustment of the AlO_x-SiN_y:H layer system

Schmid, Andreas; Fischer, Christian; Skorka, Daniel; Zuschlag, Annika; Hahn, Giso (2020) - Contribution to a conference collection
Published in: 37th European Photovoltaic Solar Energy Conference and Exhibition (EUPVSEC) : Proceedings. - München : WIP, 2020. - pp. 156-159. - eISSN 2196-100X. - ISBN 3-936338-73-6
(790.6 KiB)

Process influences during atmospheric pressure chemical vapor deposition of passivating Si-based doping glasses for PERT solar concepts

Geml, Fabian; Engelhardt, Josh; Gapp, Benjamin; Reinalter, Luis; Hahn, Giso (2020) - Contribution to a conference collection
Published in: 37th European Photovoltaic Solar Energy Conference and Exhibition (EUPVSEC) : Proceedings. - München : WIP, 2020. - pp. 214-217. - eISSN 2196-100X. - ISBN 3-936338-73-6
(956.3 KiB)

A study on the influence of aluminium oxide layer properties on contact formation

Gapp, Benjamin; Geml, Fabian; Engelhardt, Josh; Hahn, Giso (2020) - Contribution to a conference collection
Published in: 37th European Photovoltaic Solar Energy Conference and Exhibition (EUPVSEC) : Proceedings. - München : WIP, 2020. - pp. 525-528. - eISSN 2196-100X. - ISBN 3-936338-73-6
(627.5 KiB)

Effective lifetime variations significant for process evaluation or just an artifact of wafer size and quality? : An attempt to quantify material induced variations

Fischer, Christian; Schmid, Andreas; Zuschlag, Annika; Hahn, Giso (2020) - Contribution to a conference collection
Published in: 37th European Photovoltaic Solar Energy Conference and Exhibition (EUPVSEC) : Proceedings. - München : WIP, 2020. - pp. 459-461. - eISSN 2196-100X. - ISBN 3-936338-73-6

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