Novel Ag-Paste for Simultaneous Contacting of n+ and p+ Emitters through Contact-Supportive Well-Passivating Doped APCVD Layers for PERT and IBC Solar Cells

dc.contributor.authorGeml, Fabian
dc.contributor.authorGapp, Benjamin
dc.contributor.authorMehler, Melanie
dc.contributor.authorEbert, Christian
dc.contributor.authorBooth, Jonathan
dc.contributor.authorSutton, Patsy
dc.contributor.authorJohnson, Simon
dc.contributor.authorCela, Beatriz
dc.contributor.authorPlagwitz, Heiko
dc.contributor.authorHahn, Giso
dc.date.accessioned2023-07-21T11:13:57Z
dc.date.available2023-07-21T11:13:57Z
dc.date.issued2021
dc.description.abstractThe European SolarEraNet project HEAVENLY has the goal to jointly develop simultaneously contacting novel silver pastes and chemical vapor deposited (CVD) layers which are used for both, surface passivation and formation of emitter and back surface field regions. Within the project, pastes have been produced that contact n + and p+ doped regions simultaneously over a wide f iring-temperature range, achieving contact resistivities below 0.01 mΩcm2 on a 100 Ω/sq n+ emitter. The doped regions are formed by using the high -throughput, cost efficient atmospheric pressure chemical vapor deposition (APCVD) technique which enables the single-sided deposition of doped glass layers, to allow for an efficient co -diffusion step for the formation of both, emitter and back surface field regions. The glass layers remain on the wafer surface after the diffusion process, providing very good sur face passivation (Seff ≤ 2.5 cms-1) and also supporting the contact formation during the subsequent firing process of the Ag pastes. As pastes and passivation layers are developed together, the production of high -efficiency low-cost PERT (Passivated Emitter and Rear Totally diffused) and IBC (interdigitated back contact) solar cells can benefit in three ways from the project’s results: by low contact resistivities, high quality surface passivation, and an efficient processing sequence.
dc.description.versionpublisheddeu
dc.identifier.doi10.4229/EUPVSEC20212021-2DV.3.10
dc.identifier.urihttps://kops.uni-konstanz.de/handle/123456789/67411
dc.language.isoeng
dc.subject.ddc530
dc.titleNovel Ag-Paste for Simultaneous Contacting of n+ and p+ Emitters through Contact-Supportive Well-Passivating Doped APCVD Layers for PERT and IBC Solar Cellseng
dc.typeINPROCEEDINGS
dspace.entity.typePublication
kops.citation.bibtex
@inproceedings{Geml2021Novel-67411,
  year={2021},
  doi={10.4229/EUPVSEC20212021-2DV.3.10},
  title={Novel Ag-Paste for Simultaneous Contacting of n+ and p+ Emitters through Contact-Supportive Well-Passivating Doped APCVD Layers for PERT and IBC Solar Cells},
  isbn={3-936338-78-7},
  publisher={WIP},
  address={München},
  booktitle={Proceedings of 38th EU PVSEC 2021},
  pages={317--321},
  author={Geml, Fabian and Gapp, Benjamin and Mehler, Melanie and Ebert, Christian and Booth, Jonathan and Sutton, Patsy and Johnson, Simon and Cela, Beatriz and Plagwitz, Heiko and Hahn, Giso}
}
kops.citation.iso690GEML, Fabian, Benjamin GAPP, Melanie MEHLER, Christian EBERT, Jonathan BOOTH, Patsy SUTTON, Simon JOHNSON, Beatriz CELA, Heiko PLAGWITZ, Giso HAHN, 2021. Novel Ag-Paste for Simultaneous Contacting of n+ and p+ Emitters through Contact-Supportive Well-Passivating Doped APCVD Layers for PERT and IBC Solar Cells. 38th European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC 2021). München, 6. Sept. 2021 - 10. Sept. 2021. In: Proceedings of 38th EU PVSEC 2021. München: WIP, 2021, pp. 317-321. ISBN 3-936338-78-7. Available under: doi: 10.4229/EUPVSEC20212021-2DV.3.10deu
kops.citation.iso690GEML, Fabian, Benjamin GAPP, Melanie MEHLER, Christian EBERT, Jonathan BOOTH, Patsy SUTTON, Simon JOHNSON, Beatriz CELA, Heiko PLAGWITZ, Giso HAHN, 2021. Novel Ag-Paste for Simultaneous Contacting of n+ and p+ Emitters through Contact-Supportive Well-Passivating Doped APCVD Layers for PERT and IBC Solar Cells. 38th European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC 2021). München, Sep 6, 2021 - Sep 10, 2021. In: Proceedings of 38th EU PVSEC 2021. München: WIP, 2021, pp. 317-321. ISBN 3-936338-78-7. Available under: doi: 10.4229/EUPVSEC20212021-2DV.3.10eng
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