Publikation: Growth morphology in the Co/Cu(001) system
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Datum
2001
Autor:innen
Fassbender, Jürgen
Bischof, Andreas
Allenspach, Rolf
May, Ulrich
Lange, M.
Güntherodt, Gernot
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Surface Science. 2001, 488, pp. 99-106. Available under: doi: 10.1016/S0039-6028(01)01112-8
Zusammenfassung
Growth morphology in Co/Cu/Co films deposited on stepped Cu(001) is investigated by reflection high energy electron diffraction (RHEED) and magneto optical Kerr effect. The interlayer Cu film thickness is varied from fractions of a monolayer to several monolayers in order to determine the influence of Cu island nucleation on subsequent Co growth. From the analysis of the oscillations in RHEED intensity and in the uniaxial step anisotropy a growth model is proposed which extends earlier scanning tunneling microscopy observations. The different role of Co atoms at island egdes as compared to those at pre existing steps is elucidated.
Zusammenfassung in einer weiteren Sprache
Fachgebiet (DDC)
530 Physik
Schlagwörter
Reflection high energy electron diffraction (RHEED), magnetic measurements, growth, surface structure, morphology, roughness and topography
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FASSBENDER, Jürgen, Andreas BISCHOF, Rolf ALLENSPACH, Ulrich MAY, M. LANGE, Ulrich RÜDIGER, Gernot GÜNTHERODT, 2001. Growth morphology in the Co/Cu(001) system. In: Surface Science. 2001, 488, pp. 99-106. Available under: doi: 10.1016/S0039-6028(01)01112-8BibTex
@article{Fassbender2001Growt-8965, year={2001}, doi={10.1016/S0039-6028(01)01112-8}, title={Growth morphology in the Co/Cu(001) system}, volume={488}, journal={Surface Science}, pages={99--106}, author={Fassbender, Jürgen and Bischof, Andreas and Allenspach, Rolf and May, Ulrich and Lange, M. and Rüdiger, Ulrich and Güntherodt, Gernot} }
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