Publikation: Imaging optical near-fields of nanostructures
Dateien
Datum
Autor:innen
Herausgeber:innen
ISSN der Zeitschrift
Electronic ISSN
ISBN
Bibliografische Daten
Verlag
Schriftenreihe
Auflagebezeichnung
URI (zitierfähiger Link)
DOI (zitierfähiger Link)
Internationale Patentnummer
Link zur Lizenz
Angaben zur Forschungsförderung
Projekt
Open Access-Veröffentlichung
Sammlungen
Core Facility der Universität Konstanz
Titel in einer weiteren Sprache
Publikationstyp
Publikationsstatus
Erschienen in
Zusammenfassung
We present a method for imaging the optical near-fields of nanostructures, which is based on the local ablation of a smooth silicon substrate by means of a single, femtosecond laser pulse. At those locations, where the field enhancement due to a nanostructure is large, substrate material is removed. The resulting topography, imaged by scanning electron or atomic force microscopy, thus reflects the intensity distribution caused by the nanostructure at the substrate surface. With this method one avoids a possible distortion of the field distribution due to the presence of a probe tip, and reaches a resolution of a few nanometers. Several examples for the optical near-field patterns of dielectric and metallic nanostructures are given.
Zusammenfassung in einer weiteren Sprache
Fachgebiet (DDC)
Schlagwörter
Konferenz
Rezension
Zitieren
ISO 690
LEIDERER, Paul, Christof BARTELS, Juliane KOENIG-BIRK, Mario MOSBACHER, Johannes BONEBERG, 2004. Imaging optical near-fields of nanostructures. In: Applied Physics Letters. 2004, 85(22), pp. 5370-5372. Available under: doi: 10.1063/1.1819990BibTex
@article{Leiderer2004Imagi-9437, year={2004}, doi={10.1063/1.1819990}, title={Imaging optical near-fields of nanostructures}, number={22}, volume={85}, journal={Applied Physics Letters}, pages={5370--5372}, author={Leiderer, Paul and Bartels, Christof and Koenig-Birk, Juliane and Mosbacher, Mario and Boneberg, Johannes} }
RDF
<rdf:RDF xmlns:dcterms="http://purl.org/dc/terms/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:bibo="http://purl.org/ontology/bibo/" xmlns:dspace="http://digital-repositories.org/ontologies/dspace/0.1.0#" xmlns:foaf="http://xmlns.com/foaf/0.1/" xmlns:void="http://rdfs.org/ns/void#" xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > <rdf:Description rdf:about="https://kops.uni-konstanz.de/server/rdf/resource/123456789/9437"> <bibo:uri rdf:resource="http://kops.uni-konstanz.de/handle/123456789/9437"/> <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-24T17:56:31Z</dc:date> <foaf:homepage rdf:resource="http://localhost:8080/"/> <dc:contributor>Mosbacher, Mario</dc:contributor> <dcterms:issued>2004</dcterms:issued> <dcterms:abstract xml:lang="eng">We present a method for imaging the optical near-fields of nanostructures, which is based on the local ablation of a smooth silicon substrate by means of a single, femtosecond laser pulse. At those locations, where the field enhancement due to a nanostructure is large, substrate material is removed. The resulting topography, imaged by scanning electron or atomic force microscopy, thus reflects the intensity distribution caused by the nanostructure at the substrate surface. With this method one avoids a possible distortion of the field distribution due to the presence of a probe tip, and reaches a resolution of a few nanometers. Several examples for the optical near-field patterns of dielectric and metallic nanostructures are given.</dcterms:abstract> <dc:creator>Leiderer, Paul</dc:creator> <dc:format>application/pdf</dc:format> <dcterms:bibliographicCitation>First publ. in: Applied Physics Letters 85 (2004), 22, pp. 5370-5372</dcterms:bibliographicCitation> <dc:creator>Koenig-Birk, Juliane</dc:creator> <dc:creator>Boneberg, Johannes</dc:creator> <dc:language>eng</dc:language> <dc:creator>Mosbacher, Mario</dc:creator> <dc:contributor>Leiderer, Paul</dc:contributor> <dc:contributor>Koenig-Birk, Juliane</dc:contributor> <dc:creator>Bartels, Christof</dc:creator> <dc:contributor>Boneberg, Johannes</dc:contributor> <dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/> <dc:contributor>Bartels, Christof</dc:contributor> <dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/> <dcterms:hasPart rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/9437/1/332_apl_2004.pdf"/> <dcterms:rights rdf:resource="http://creativecommons.org/licenses/by-nc-nd/2.0/"/> <void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/> <dspace:hasBitstream rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/9437/1/332_apl_2004.pdf"/> <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-24T17:56:31Z</dcterms:available> <dcterms:title>Imaging optical near-fields of nanostructures</dcterms:title> <dc:rights>Attribution-NonCommercial-NoDerivs 2.0 Generic</dc:rights> </rdf:Description> </rdf:RDF>