Publikation: Analysis and Reduction of Lifetime-limiting Defects in Multicrystalline Silicon
Dateien
Datum
Autor:innen
Herausgeber:innen
ISSN der Zeitschrift
Electronic ISSN
ISBN
Bibliografische Daten
Verlag
Schriftenreihe
Auflagebezeichnung
URI (zitierfähiger Link)
Internationale Patentnummer
Angaben zur Forschungsförderung
Projekt
Open Access-Veröffentlichung
Sammlungen
Core Facility der Universität Konstanz
Titel in einer weiteren Sprache
Publikationstyp
Publikationsstatus
Erschienen in
Zusammenfassung
Block-cast multicrystalline silicon is the working horse for photovoltaic devices. Multicrystalline silicon solar cells can be produced on a lower budget compared to those processed from monocrystalline material, but efficiencies are limited to a lower level by defects as impurities, grain boundaries or dislocations.
The impact of different defect types is characterized in this work. Phosphorous gettering and hydrogenation are known to reduce some of these effects, but most of the underlying physical mechanisms are unknown.
In this work, among other mechanisms, especially the interaction between hydrogen diffusing into the multicrystalline silicon bulk and interstitial iron is illuminated and a model explaining the observed effect is suggested.
Another possibility of improving multicrystalline silicon material quality is to avoid the introduction of impurities into the crystal by using high-purity materials for the crystallization process. Therefore the quality of multicrystalline silicon grown in high-purity crucibles coated with high-purity silicon nitride is evaluated in this work.
Zusammenfassung in einer weiteren Sprache
Fachgebiet (DDC)
Schlagwörter
Konferenz
Rezension
Zitieren
ISO 690
KARZEL, Philipp, 2014. Analysis and Reduction of Lifetime-limiting Defects in Multicrystalline Silicon [Dissertation]. Konstanz: University of Konstanz. München : Dr. Hut. ISBN 978-3-8439-1537-3BibTex
@phdthesis{Karzel2014Analy-28468, year={2014}, publisher={München : Dr. Hut}, title={Analysis and Reduction of Lifetime-limiting Defects in Multicrystalline Silicon}, author={Karzel, Philipp}, address={Konstanz}, school={Universität Konstanz} }
RDF
<rdf:RDF xmlns:dcterms="http://purl.org/dc/terms/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:bibo="http://purl.org/ontology/bibo/" xmlns:dspace="http://digital-repositories.org/ontologies/dspace/0.1.0#" xmlns:foaf="http://xmlns.com/foaf/0.1/" xmlns:void="http://rdfs.org/ns/void#" xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > <rdf:Description rdf:about="https://kops.uni-konstanz.de/server/rdf/resource/123456789/28468"> <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2014-07-18T09:58:54Z</dc:date> <dcterms:issued>2014</dcterms:issued> <bibo:issn>978-3-8439-1537-3</bibo:issn> <dc:creator>Karzel, Philipp</dc:creator> <foaf:homepage rdf:resource="http://localhost:8080/"/> <dc:rights>terms-of-use</dc:rights> <dcterms:abstract xml:lang="eng">Block-cast multicrystalline silicon is the working horse for photovoltaic devices. Multicrystalline silicon solar cells can be produced on a lower budget compared to those processed from monocrystalline material, but efficiencies are limited to a lower level by defects as impurities, grain boundaries or dislocations.<br /><br /><br /><br />The impact of different defect types is characterized in this work. Phosphorous gettering and hydrogenation are known to reduce some of these effects, but most of the underlying physical mechanisms are unknown.<br /><br /><br /><br />In this work, among other mechanisms, especially the interaction between hydrogen diffusing into the multicrystalline silicon bulk and interstitial iron is illuminated and a model explaining the observed effect is suggested.<br /><br /><br /><br />Another possibility of improving multicrystalline silicon material quality is to avoid the introduction of impurities into the crystal by using high-purity materials for the crystallization process. Therefore the quality of multicrystalline silicon grown in high-purity crucibles coated with high-purity silicon nitride is evaluated in this work.</dcterms:abstract> <dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/> <dc:publisher>München : Dr. Hut</dc:publisher> <dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/> <bibo:uri rdf:resource="http://kops.uni-konstanz.de/handle/123456789/28468"/> <dcterms:rights rdf:resource="https://rightsstatements.org/page/InC/1.0/"/> <dc:contributor>Karzel, Philipp</dc:contributor> <dc:language>eng</dc:language> <void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/> <dcterms:title>Analysis and Reduction of Lifetime-limiting Defects in Multicrystalline Silicon</dcterms:title> <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2014-07-18T09:58:54Z</dcterms:available> </rdf:Description> </rdf:RDF>