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Angular dependence of the secondary electron emission crystal current : effects of surface modification

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Angular_dependence_1990.pdf
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1990

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Puckrin, E. R.
Slavin, Alan J.

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Journal of vacuum science & technology. 1990, 8(2), pp. 797-799. ISSN 0734-2101. Available under: doi: 10.1116/1.576920

Zusammenfassung

The variation of the angle between the incident electron beam and sample surface contributes in two ways to the secondary electron emission from single crystals. These contributions are a monotonically varying background due to the changing number ofsecondaries produced near the surface, and an oscillatory component previously explained as a bulk effect related to Kikuchi patterns. This work shows that for emission from a Au(111) surface, the background can be described well by a simple model based on the semiempirical theory of Kanaya and Kawakatsu. It also provides additional support for the explanation of the oscillations as a bulk effect by showing that the oscillation amplitude remains essentially unchanged either by surface sputtering or by the deposition of a thin lead layer. The presence of these oscillations requires some care ill the use of the secondary electron crystal current as a measure of the thickness of thin metal films.

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530 Physik

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ISO 690PEETERS, Frank, E. R. PUCKRIN, Alan J. SLAVIN, 1990. Angular dependence of the secondary electron emission crystal current : effects of surface modification. In: Journal of vacuum science & technology. 1990, 8(2), pp. 797-799. ISSN 0734-2101. Available under: doi: 10.1116/1.576920
BibTex
@article{Peeters1990Angul-7416,
  year={1990},
  doi={10.1116/1.576920},
  title={Angular dependence of the secondary electron emission crystal current : effects of surface modification},
  number={2},
  volume={8},
  issn={0734-2101},
  journal={Journal of vacuum science & technology},
  pages={797--799},
  author={Peeters, Frank and Puckrin, E. R. and Slavin, Alan J.}
}
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