Signatures of two-level defects in the temperature-dependent damping of nanomechanical silicon nitride resonators
| dc.contributor.author | Faust, Thomas | deu |
| dc.contributor.author | Rieger, Johannes | deu |
| dc.contributor.author | Seitner, Maximilian | |
| dc.contributor.author | Kotthaus, Jörg P. | deu |
| dc.contributor.author | Weig, Eva M. | |
| dc.date.accessioned | 2013-11-04T10:40:20Z | deu |
| dc.date.available | 2013-11-04T10:40:20Z | deu |
| dc.date.issued | 2013 | deu |
| dc.description.abstract | The damping rates of high quality factor nanomechanical resonators are well beyond intrinsic limits. Here, we explore the underlying microscopic loss mechanisms by investigating the temperature-dependent damping of the fundamental and third harmonic transverse flexural mode of a doubly clamped silicon nitride string. It exhibits characteristic maxima reminiscent of two-level defects typical for amorphous materials. Coupling to those defects relaxes the momentum selection rules, allowing energy transfer from discrete long wavelength resonator modes to the high frequency phonon environment. | eng |
| dc.description.version | published | |
| dc.identifier.arxiv | 1310.3671 | deu |
| dc.identifier.ppn | 395198747 | deu |
| dc.identifier.uri | http://kops.uni-konstanz.de/handle/123456789/25032 | |
| dc.language.iso | eng | deu |
| dc.legacy.dateIssued | 2013-11-04 | deu |
| dc.rights | terms-of-use | deu |
| dc.rights.uri | https://rightsstatements.org/page/InC/1.0/ | deu |
| dc.subject.ddc | 530 | deu |
| dc.title | Signatures of two-level defects in the temperature-dependent damping of nanomechanical silicon nitride resonators | eng |
| dc.type | PREPRINT | deu |
| dspace.entity.type | Publication | |
| kops.citation.bibtex | @unpublished{Faust2013Signa-25032,
year={2013},
title={Signatures of two-level defects in the temperature-dependent damping of nanomechanical silicon nitride resonators},
author={Faust, Thomas and Rieger, Johannes and Seitner, Maximilian and Kotthaus, Jörg P. and Weig, Eva M.}
} | |
| kops.citation.iso690 | FAUST, Thomas, Johannes RIEGER, Maximilian SEITNER, Jörg P. KOTTHAUS, Eva M. WEIG, 2013. Signatures of two-level defects in the temperature-dependent damping of nanomechanical silicon nitride resonators | deu |
| kops.citation.iso690 | FAUST, Thomas, Johannes RIEGER, Maximilian SEITNER, Jörg P. KOTTHAUS, Eva M. WEIG, 2013. Signatures of two-level defects in the temperature-dependent damping of nanomechanical silicon nitride resonators | eng |
| kops.citation.rdf | <rdf:RDF
xmlns:dcterms="http://purl.org/dc/terms/"
xmlns:dc="http://purl.org/dc/elements/1.1/"
xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#"
xmlns:bibo="http://purl.org/ontology/bibo/"
xmlns:dspace="http://digital-repositories.org/ontologies/dspace/0.1.0#"
xmlns:foaf="http://xmlns.com/foaf/0.1/"
xmlns:void="http://rdfs.org/ns/void#"
xmlns:xsd="http://www.w3.org/2001/XMLSchema#" >
<rdf:Description rdf:about="https://kops.uni-konstanz.de/server/rdf/resource/123456789/25032">
<dc:creator>Kotthaus, Jörg P.</dc:creator>
<dc:rights>terms-of-use</dc:rights>
<dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2013-11-04T10:40:20Z</dcterms:available>
<dc:creator>Rieger, Johannes</dc:creator>
<dc:contributor>Weig, Eva M.</dc:contributor>
<dc:contributor>Kotthaus, Jörg P.</dc:contributor>
<dc:language>eng</dc:language>
<dc:contributor>Faust, Thomas</dc:contributor>
<dcterms:issued>2013</dcterms:issued>
<dc:contributor>Rieger, Johannes</dc:contributor>
<dcterms:title>Signatures of two-level defects in the temperature-dependent damping of nanomechanical silicon nitride resonators</dcterms:title>
<dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
<dcterms:hasPart rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/25032/1/Faust_250322.pdf"/>
<dc:creator>Weig, Eva M.</dc:creator>
<foaf:homepage rdf:resource="http://localhost:8080/"/>
<dc:creator>Faust, Thomas</dc:creator>
<dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
<void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/>
<dcterms:rights rdf:resource="https://rightsstatements.org/page/InC/1.0/"/>
<bibo:uri rdf:resource="http://kops.uni-konstanz.de/handle/123456789/25032"/>
<dc:contributor>Seitner, Maximilian</dc:contributor>
<dcterms:abstract xml:lang="eng">The damping rates of high quality factor nanomechanical resonators are well beyond intrinsic limits. Here, we explore the underlying microscopic loss mechanisms by investigating the temperature-dependent damping of the fundamental and third harmonic transverse flexural mode of a doubly clamped silicon nitride string. It exhibits characteristic maxima reminiscent of two-level defects typical for amorphous materials. Coupling to those defects relaxes the momentum selection rules, allowing energy transfer from discrete long wavelength resonator modes to the high frequency phonon environment.</dcterms:abstract>
<dspace:hasBitstream rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/25032/1/Faust_250322.pdf"/>
<dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2013-11-04T10:40:20Z</dc:date>
<dc:creator>Seitner, Maximilian</dc:creator>
</rdf:Description>
</rdf:RDF> | |
| kops.description.openAccess | openaccessgreen | |
| kops.flag.knbibliography | true | |
| kops.identifier.nbn | urn:nbn:de:bsz:352-250322 | deu |
| kops.submitter.email | anja.seitz@uni-konstanz.de | deu |
| relation.isAuthorOfPublication | 89990071-1ed7-4eef-b334-58857107e8ee | |
| relation.isAuthorOfPublication | 63ad8ba3-12b1-4658-a9e2-b067d0af58ce | |
| relation.isAuthorOfPublication.latestForDiscovery | 89990071-1ed7-4eef-b334-58857107e8ee |
Dateien
Originalbündel
1 - 1 von 1
Vorschaubild nicht verfügbar
- Name:
- Faust_250322.pdf
- Größe:
- 324.3 KB
- Format:
- Adobe Portable Document Format
Lizenzbündel
1 - 1 von 1
Vorschaubild nicht verfügbar
- Name:
- license.txt
- Größe:
- 1.92 KB
- Format:
- Plain Text
- Beschreibung:

