Publikation: Scattered light fluorescence microscopy : imaging through turbid layers
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2010
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Vellekoop, Ivo M.
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Optics Letters. Optical Society of America (OSA). 2010, 35(8), pp. 1245-1247. ISSN 0146-9592. eISSN 1539-4794. Available under: doi: 10.1364/OL.35.001245
Zusammenfassung
A major limitation of any type of microscope is the penetration depth in turbid tissue. Here, we demonstrate a fundamentally novel kind of fluorescence microscope that images through optically thick turbid layers. The microscope uses scattered light, rather than light propagating along a straight path, for imaging with subwavelength resolution. Our method uses constructive interference to focus scattered laser light through the turbid layer. Microscopic fluorescent structures behind the layer were imaged by raster scanning the focus.
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VELLEKOOP, Ivo M., Christof M. AEGERTER, 2010. Scattered light fluorescence microscopy : imaging through turbid layers. In: Optics Letters. Optical Society of America (OSA). 2010, 35(8), pp. 1245-1247. ISSN 0146-9592. eISSN 1539-4794. Available under: doi: 10.1364/OL.35.001245BibTex
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title={Scattered light fluorescence microscopy : imaging through turbid layers},
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journal={Optics Letters},
pages={1245--1247},
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<dcterms:abstract xml:lang="eng">A major limitation of any type of microscope is the penetration depth in turbid tissue. Here, we demonstrate a fundamentally novel kind of fluorescence microscope that images through optically thick turbid layers. The microscope uses scattered light, rather than light propagating along a straight path, for imaging with subwavelength resolution. Our method uses constructive interference to focus scattered laser light through the turbid layer. Microscopic fluorescent structures behind the layer were imaged by raster scanning the focus.</dcterms:abstract>
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