Publikation:

Cyclotron resonance for 2D electrons on helium films above rough substrates

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319_physicaE_2003.pdf
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2003

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Würl, Andreas
Klier, Jürgen
Shikin, Valeri

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Physica / E [Low-dimensional Systems and Nanostructures]. 2003, 18(1-3), pp. 184-185. Available under: doi: 10.1016/S1386-9477(02)01087-1

Zusammenfassung

An investigation of the microwave absorption for two-dimennonal electron systems (2DES) on helium films and in the presence of a cyclotron resonance (CR) inagietic field are presented. Measured data are expIained by a recently proposed two-fraction model of the 2DES, which makes the general structure of the microwave absorption understandable. The fraction of localized and free electrons can be precisely determrned and rts dependence on the thickness of the helium film above the roughness of the underlying sollid substrate is understood.

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Fachgebiet (DDC)
530 Physik

Schlagwörter

2D electron systems, Cyclotroll resonance, Thin helium films, Surface roughness

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ISO 690WÜRL, Andreas, Jürgen KLIER, Paul LEIDERER, Valeri SHIKIN, 2003. Cyclotron resonance for 2D electrons on helium films above rough substrates. In: Physica / E [Low-dimensional Systems and Nanostructures]. 2003, 18(1-3), pp. 184-185. Available under: doi: 10.1016/S1386-9477(02)01087-1
BibTex
@article{Wurl2003Cyclo-9426,
  year={2003},
  doi={10.1016/S1386-9477(02)01087-1},
  title={Cyclotron resonance for 2D electrons on helium films above rough substrates},
  number={1-3},
  volume={18},
  journal={Physica / E [Low-dimensional Systems and Nanostructures]},
  pages={184--185},
  author={Würl, Andreas and Klier, Jürgen and Leiderer, Paul and Shikin, Valeri}
}
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