Publikation: Statistical analysis of current-induced switching in metallic atomic-size contacts
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Current-driven conductance switching in atomic-size contacts has been attributed to reversible and vibration-mediated atomic rearrangements. Here, we present a comprehensive statistical analysis on the switching properties of atomic gold, copper, and aluminium contacts fabricated by mechanically controllable break junctions. The comparative analysis shows that various bi- and multilevel switching patterns can exist with volatile as well as nonvolatile features, and with distinct material-dependent preferences among the three metals. In addition, we apply different current-biasing protocols to identify intrinsic and material-dependent switching properties under variable boundary conditions. To explore the stability of such memory states, we reveal the stochastic nature of the underlying switching mechanism and suggest a simple qualitative approach to estimate the creation and failure rate for such switching events. The approach is inspired by atomic-scale electromigration models accounting for the observed switching voltages and conductance jumps.
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STROHMEIER, Marcel, Franz HERBST, Patrick HAIBER, David WEBER, Elke SCHEER, 2025. Statistical analysis of current-induced switching in metallic atomic-size contacts. In: Physical Review B. American Physical Society (APS). 2025, 111(3), 035407. ISSN 2469-9950. eISSN 2469-9969. Verfügbar unter: doi: 10.1103/physrevb.111.035407BibTex
@article{Strohmeier2025-01-06Stati-71816, year={2025}, doi={10.1103/physrevb.111.035407}, title={Statistical analysis of current-induced switching in metallic atomic-size contacts}, number={3}, volume={111}, issn={2469-9950}, journal={Physical Review B}, author={Strohmeier, Marcel and Herbst, Franz and Haiber, Patrick and Weber, David and Scheer, Elke}, note={Article Number: 035407} }
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