Publikation: Evidence for quantum melting in the two-dimensional electron system on a thin helium film
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1996
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Surface Science. 1996, 361-362, pp. 831-834. Available under: doi: 10.1016/0039-6028(96)00544-4
Zusammenfassung
The real and imaginary parts of the dielectric response of surface state electrons (SSE) on helium films adsorbed on oxidized Si platelets have been measured with a microwave cavity at 10 GHz. Preliminary measurements taken at T= 1.2 K show an abrupt increase of the SSE mobility at electron densitis near 10" cm-2, which is sugestive of quantum melting of the Wigner solid. Reproducibility of this effect on different Si wafers is discussed.
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GÜNZLER, Tobias, Bernd BITNAR, Giampaolo MISTURA, Stephan NESER, Paul LEIDERER, 1996. Evidence for quantum melting in the two-dimensional electron system on a thin helium film. In: Surface Science. 1996, 361-362, pp. 831-834. Available under: doi: 10.1016/0039-6028(96)00544-4BibTex
@article{Gunzler1996Evide-9339, year={1996}, doi={10.1016/0039-6028(96)00544-4}, title={Evidence for quantum melting in the two-dimensional electron system on a thin helium film}, volume={361-362}, journal={Surface Science}, pages={831--834}, author={Günzler, Tobias and Bitnar, Bernd and Mistura, Giampaolo and Neser, Stephan and Leiderer, Paul} }
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