Publikation:

Influence of the Al-Si Alloy Formation in narrow dielectric barrier openings on the specific contact resistance

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Urrejola_Influence.pdf
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2010

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Peter, Kristian
Glatz-Reichenbach, Joachim
Wefringhaus, Eckard
Schubert, Gunnar

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Beitrag zu einem Konferenzband
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Published

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EUROPÄISCHE KOMMISSION GEMEINSAME FORSCHUNGSSTELLE, , ed.. EU PVSEC proceedings : 25th European Photovoltaic Solar Energy Conference and Exhibition. Munich, Germany: WIP-Renewable Energies, 2010, pp. 2176-2179. ISBN 3-936338-26-4. Available under: doi: 10.4229/25thEUPVSEC2010-2CV.3.31

Zusammenfassung

A full area Al-alloyed back surface field layer usually forms the rear side of standard p-type Si solar cells. However, a dielectric rear surface passivation with only small local contact openings has significant advantages over the standard fully covered Al back contact, and enables higher efficiencies on thinner wafers. This article presents a specific analysis of the formation of small localized contacts between Al and Si. We observe that the contact resistivity of screen printed Al fingers depends on the homogeneity of the Al-Si alloy formation below the contacts. The contact resistivity decreases when reducing the contact area, due to a more homogeneous alloy formation. The optimal contact formation is achieved with contact areas smaller than 50 – 80 mm in diameter.

Zusammenfassung in einer weiteren Sprache

Fachgebiet (DDC)
530 Physik

Schlagwörter

solar cells, silicon alloys, aluminium, alloys, compounds, gravity, sintering, contact resistance, chemical interdiffusion, firing (materials), dielectric thin films, passivation, protective coating, scanning electron microscopy, back-surface-field, voids (solid), kirkendall effect

Konferenz

25th European Photovoltaic Solar Energy Conference and Exhibition. 5th World Conference on photovoltaic Energy Conversion, 6. Sept. 2010 - 10. Sept. 2010, Valencia, Spain
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ISO 690URREJOLA, Elias, Kristian PETER, Joachim GLATZ-REICHENBACH, Eckard WEFRINGHAUS, Heiko PLAGWITZ, Gunnar SCHUBERT, 2010. Influence of the Al-Si Alloy Formation in narrow dielectric barrier openings on the specific contact resistance. 25th European Photovoltaic Solar Energy Conference and Exhibition. 5th World Conference on photovoltaic Energy Conversion. Valencia, Spain, 6. Sept. 2010 - 10. Sept. 2010. In: EUROPÄISCHE KOMMISSION GEMEINSAME FORSCHUNGSSTELLE, , ed.. EU PVSEC proceedings : 25th European Photovoltaic Solar Energy Conference and Exhibition. Munich, Germany: WIP-Renewable Energies, 2010, pp. 2176-2179. ISBN 3-936338-26-4. Available under: doi: 10.4229/25thEUPVSEC2010-2CV.3.31
BibTex
@inproceedings{Urrejola2010Influ-19490,
  year={2010},
  doi={10.4229/25thEUPVSEC2010-2CV.3.31},
  title={Influence of the Al-Si Alloy Formation in narrow dielectric barrier openings on the specific contact resistance},
  isbn={3-936338-26-4},
  publisher={WIP-Renewable Energies},
  address={Munich, Germany},
  booktitle={EU PVSEC proceedings : 25th European Photovoltaic Solar Energy Conference and Exhibition},
  pages={2176--2179},
  editor={Europäische Kommission Gemeinsame Forschungsstelle},
  author={Urrejola, Elias and Peter, Kristian and Glatz-Reichenbach, Joachim and Wefringhaus, Eckard and Plagwitz, Heiko and Schubert, Gunnar}
}
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