Scanning probe nanostructuring of YBa2Cu307 : a corrosion induced abrasion

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209_applphyslett_1997.pdf
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1997
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Böhmisch, Mathias
Ochmann, Michael
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Applied Physics Letters. 1997, 71(26), pp. 3805-3807. ISSN 0003-6951. eISSN 1077-3118. Available under: doi: 10.1063/1.120511
Zusammenfassung

Nanostructuring experiments were performed on a YBa2Cu307 thin film surface with an atomic force microscope (AFM) with a conductive tip. Measurements of the local conductivity with the AFM tip show that corrosion towards a nonconducting surface occurs on a timescale of hours under ambient conditions. The corroded surface can easily be abraded, whereas the clean YBa2Cu307 surface is comparably resistive against mechanical forces. The corrosion is promoted by an electric current at positive sample bias. Thus it can be concluded that the nanostructuring process performed in former experiments with the scanning tunneling microscope consists of two steps: corrosion and succeeding abrasion.

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ISO 690BONEBERG, Johannes, Mathias BÖHMISCH, Michael OCHMANN, Paul LEIDERER, 1997. Scanning probe nanostructuring of YBa2Cu307 : a corrosion induced abrasion. In: Applied Physics Letters. 1997, 71(26), pp. 3805-3807. ISSN 0003-6951. eISSN 1077-3118. Available under: doi: 10.1063/1.120511
BibTex
@article{Boneberg1997Scann-5136,
  year={1997},
  doi={10.1063/1.120511},
  title={Scanning probe nanostructuring of YBa2Cu307 : a corrosion induced abrasion},
  number={26},
  volume={71},
  issn={0003-6951},
  journal={Applied Physics Letters},
  pages={3805--3807},
  author={Boneberg, Johannes and Böhmisch, Mathias and Ochmann, Michael and Leiderer, Paul}
}
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