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Further investigations on the avoidance of boron-oxygen related degradation by means of regeneration

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Herguth_opus-121363.pdf
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2007

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Schubert, Gunnar
Käs, Martin

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The compiled state-of-the-art of PV solar technology and deployment : 22 nd European Photovoltaic Solar Energy Conference, EU PVSEC ; proceedings of the international conference, held in Milan, Italy, 3 - 7 September 2007. München: WIP-Renewable Energies, 2007, pp. 893-896

Zusammenfassung

Boron and oxygen contamination in Czochralski (Cz) grown silicon leads in the short term to a degradation of the charge carrier lifetime due to the formation of recombination active complexes. For longer times these harmful complexes may be neutralized by a regeneration called reaction. Supported by elevated temperatures, a conversion of the recombination active species into an inactive species is induced by the presence of charge carriers injected by light or bias voltages. In this contribution, the influence of light intensity and bias voltages is discussed.

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530 Physik

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EU PVSEC, 3. Sept. 2007 - 7. Sept. 2007, Milan, Italy
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ISO 690HERGUTH, Axel, Gunnar SCHUBERT, Martin KÄS, Giso HAHN, 2007. Further investigations on the avoidance of boron-oxygen related degradation by means of regeneration. EU PVSEC. Milan, Italy, 3. Sept. 2007 - 7. Sept. 2007. In: The compiled state-of-the-art of PV solar technology and deployment : 22 nd European Photovoltaic Solar Energy Conference, EU PVSEC ; proceedings of the international conference, held in Milan, Italy, 3 - 7 September 2007. München: WIP-Renewable Energies, 2007, pp. 893-896
BibTex
@inproceedings{Herguth2007Furth-917,
  year={2007},
  title={Further investigations on the avoidance of boron-oxygen related degradation by means of regeneration},
  publisher={WIP-Renewable Energies},
  address={München},
  booktitle={The compiled state-of-the-art of PV solar technology and deployment : 22 nd European Photovoltaic Solar Energy Conference, EU PVSEC ; proceedings of the international conference, held in Milan, Italy, 3 - 7 September 2007},
  pages={893--896},
  author={Herguth, Axel and Schubert, Gunnar and Käs, Martin and Hahn, Giso}
}
RDF
<rdf:RDF
    xmlns:dcterms="http://purl.org/dc/terms/"
    xmlns:dc="http://purl.org/dc/elements/1.1/"
    xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#"
    xmlns:bibo="http://purl.org/ontology/bibo/"
    xmlns:dspace="http://digital-repositories.org/ontologies/dspace/0.1.0#"
    xmlns:foaf="http://xmlns.com/foaf/0.1/"
    xmlns:void="http://rdfs.org/ns/void#"
    xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > 
  <rdf:Description rdf:about="https://kops.uni-konstanz.de/server/rdf/resource/123456789/917">
    <dc:language>eng</dc:language>
    <dc:contributor>Herguth, Axel</dc:contributor>
    <dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
    <dcterms:issued>2007</dcterms:issued>
    <dcterms:bibliographicCitation>Publ. in: The compiled state-of-the-art of PV solar technology and deployment : 22nd European Photovoltaic Solar Energy Conference, EU PVSEC ; proceedings of the international conference, held in Milan, Italy, 3 - 7 September 2007. München: WIP-Renewable Energies, 2007, pp. 893-896</dcterms:bibliographicCitation>
    <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-22T17:51:53Z</dcterms:available>
    <dc:contributor>Hahn, Giso</dc:contributor>
    <void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/>
    <dc:creator>Schubert, Gunnar</dc:creator>
    <dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
    <dcterms:title>Further investigations on the avoidance of boron-oxygen related degradation by means of regeneration</dcterms:title>
    <dcterms:hasPart rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/917/1/Herguth_opus-121363.pdf"/>
    <dc:contributor>Käs, Martin</dc:contributor>
    <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-22T17:51:53Z</dc:date>
    <dcterms:rights rdf:resource="https://rightsstatements.org/page/InC/1.0/"/>
    <bibo:uri rdf:resource="http://kops.uni-konstanz.de/handle/123456789/917"/>
    <foaf:homepage rdf:resource="http://localhost:8080/"/>
    <dcterms:abstract xml:lang="eng">Boron and oxygen contamination in Czochralski (Cz) grown silicon leads in the short term to a degradation of the charge carrier lifetime due to the formation of recombination active complexes. For longer times these harmful complexes may be neutralized by a  regeneration  called reaction. Supported by elevated temperatures, a conversion of the recombination active species into an inactive species is induced by the presence of charge carriers injected by light or bias voltages. In this contribution, the influence of light intensity and bias voltages is discussed.</dcterms:abstract>
    <dspace:hasBitstream rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/917/1/Herguth_opus-121363.pdf"/>
    <dc:creator>Käs, Martin</dc:creator>
    <dc:contributor>Schubert, Gunnar</dc:contributor>
    <dc:creator>Herguth, Axel</dc:creator>
    <dc:rights>terms-of-use</dc:rights>
    <dc:creator>Hahn, Giso</dc:creator>
  </rdf:Description>
</rdf:RDF>

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xmlui.Submission.submit.DescribeStep.inputForms.label.kops_note_fromSubmitter

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