Publikation:

Addressing some of the technical challenges associated liquid phase S/TEM studies of particle, nucleation, growth and assembly

Vorschaubild

Dateien

Zu diesem Dokument gibt es keine Dateien.

Datum

2019

Autor:innen

Zhu, Guomin
De Yoreo, Jim

Herausgeber:innen

Kontakt

ISSN der Zeitschrift

Electronic ISSN

ISBN

Bibliografische Daten

Verlag

Schriftenreihe

Auflagebezeichnung

URI (zitierfähiger Link)
DOI (zitierfähiger Link)
https://doi.org/10.1016/j.micron.2018.12.001
ArXiv-ID

Internationale Patentnummer

Angaben zur Forschungsförderung

Projekt

Open Access-Veröffentlichung

Sammlungen

Chemie: Publikationen
Core Facility der Universität Konstanz

Gesperrt bis

Titel in einer weiteren Sprache

Publikationstyp
Zeitschriftenartikel
Publikationsstatus
Published

Erschienen in

Micron. 2019, 118, pp. 35-42. ISSN 0968-4328. eISSN 1878-4291. Available under: doi: 10.1016/j.micron.2018.12.001

Zusammenfassung

In situ liquid phase scanning/ transmission electron microscopy (LP-S/TEM), enables direct observation of particle formation and evolution in the hydrated liquid state. Though powerful, this technique has significant technical limitations, which need to be carefully addressed in order to obtain reliable quantitative data. In this paper, we highlight several common artifacts seen in the LP-TEM including electron-beam induced particle dissolution and motion, particle-membrane adhesion, contamination, and triggering reactions. We describe our efforts to overcome these problems by modifying solution and interface chemistry, maintaining solution flow, performing systematic post in situ analyses on the samples and applying controlled heating.

Zusammenfassung in einer weiteren Sprache

Fachgebiet (DDC)
540 Chemie

Schlagwörter

in situS/TEM, flow liquid phase, dissolution, heating, crystallization

Konferenz

Rezension
undefined / . - undefined, undefined

Forschungsvorhaben

Organisationseinheiten

Zeitschriftenheft

Zugehörige Datensätze in KOPS

Zitieren

ISO 690ZHU, Guomin, Holger REINER, Helmut CÖLFEN, Jim DE YOREO, 2019. Addressing some of the technical challenges associated liquid phase S/TEM studies of particle, nucleation, growth and assembly. In: Micron. 2019, 118, pp. 35-42. ISSN 0968-4328. eISSN 1878-4291. Available under: doi: 10.1016/j.micron.2018.12.001
BibTex
@article{Zhu2019-03Addre-44261,
  year={2019},
  doi={10.1016/j.micron.2018.12.001},
  title={Addressing some of the technical challenges associated liquid phase S/TEM studies of particle, nucleation, growth and assembly},
  volume={118},
  issn={0968-4328},
  journal={Micron},
  pages={35--42},
  author={Zhu, Guomin and Reiner, Holger and Cölfen, Helmut and De Yoreo, Jim}
}
RDF
<rdf:RDF
    xmlns:dcterms="http://purl.org/dc/terms/"
    xmlns:dc="http://purl.org/dc/elements/1.1/"
    xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#"
    xmlns:bibo="http://purl.org/ontology/bibo/"
    xmlns:dspace="http://digital-repositories.org/ontologies/dspace/0.1.0#"
    xmlns:foaf="http://xmlns.com/foaf/0.1/"
    xmlns:void="http://rdfs.org/ns/void#"
    xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > 
  <rdf:Description rdf:about="https://kops.uni-konstanz.de/server/rdf/resource/123456789/44261">
    <dc:contributor>Cölfen, Helmut</dc:contributor>
    <dc:creator>Zhu, Guomin</dc:creator>
    <bibo:uri rdf:resource="https://kops.uni-konstanz.de/handle/123456789/44261"/>
    <void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/>
    <dcterms:issued>2019-03</dcterms:issued>
    <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2018-12-11T12:28:13Z</dc:date>
    <dc:creator>Reiner, Holger</dc:creator>
    <dcterms:title>Addressing some of the technical challenges associated liquid phase S/TEM studies of particle, nucleation, growth and assembly</dcterms:title>
    <dc:contributor>De Yoreo, Jim</dc:contributor>
    <dc:contributor>Reiner, Holger</dc:contributor>
    <dc:creator>Cölfen, Helmut</dc:creator>
    <dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/29"/>
    <dc:creator>De Yoreo, Jim</dc:creator>
    <dcterms:abstract xml:lang="eng">In situ liquid phase scanning/ transmission electron microscopy (LP-S/TEM), enables direct observation of particle formation and evolution in the hydrated liquid state. Though powerful, this technique has significant technical limitations, which need to be carefully addressed in order to obtain reliable quantitative data. In this paper, we highlight several common artifacts seen in the LP-TEM including electron-beam induced particle dissolution and motion, particle-membrane adhesion, contamination, and triggering reactions. We describe our efforts to overcome these problems by modifying solution and interface chemistry, maintaining solution flow, performing systematic post in situ analyses on the samples and applying controlled heating.</dcterms:abstract>
    <dc:contributor>Zhu, Guomin</dc:contributor>
    <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2018-12-11T12:28:13Z</dcterms:available>
    <dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/29"/>
    <dc:language>eng</dc:language>
    <foaf:homepage rdf:resource="http://localhost:8080/"/>
  </rdf:Description>
</rdf:RDF>

Interner Vermerk

xmlui.Submission.submit.DescribeStep.inputForms.label.kops_note_fromSubmitter

Kontakt
URL der Originalveröffentl.

Prüfdatum der URL

Prüfungsdatum der Dissertation

Finanzierungsart

Kommentar zur Publikation

Allianzlizenz
Corresponding Authors der Uni Konstanz vorhanden
Internationale Co-Autor:innen
Universitätsbibliographie
Ja
Begutachtet
Ja
Diese Publikation teilen