Addressing some of the technical challenges associated liquid phase S/TEM studies of particle, nucleation, growth and assembly

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2019
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Zhu, Guomin
De Yoreo, Jim
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10.1016/j.micron.2018.12.001
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Micron ; 118 (2019). - pp. 35-42. - ISSN 0968-4328. - eISSN 1878-4291
Abstract
In situ liquid phase scanning/ transmission electron microscopy (LP-S/TEM), enables direct observation of particle formation and evolution in the hydrated liquid state. Though powerful, this technique has significant technical limitations, which need to be carefully addressed in order to obtain reliable quantitative data. In this paper, we highlight several common artifacts seen in the LP-TEM including electron-beam induced particle dissolution and motion, particle-membrane adhesion, contamination, and triggering reactions. We describe our efforts to overcome these problems by modifying solution and interface chemistry, maintaining solution flow, performing systematic post in situ analyses on the samples and applying controlled heating.
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540 Chemistry
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in situS/TEM, flow liquid phase, dissolution, heating, crystallization
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ISO 690ZHU, Guomin, Holger REINER, Helmut CĂ–LFEN, Jim DE YOREO, 2019. Addressing some of the technical challenges associated liquid phase S/TEM studies of particle, nucleation, growth and assembly. In: Micron. 118, pp. 35-42. ISSN 0968-4328. eISSN 1878-4291. Available under: doi: 10.1016/j.micron.2018.12.001
BibTex
@article{Zhu2019-03Addre-44261,
  year={2019},
  doi={10.1016/j.micron.2018.12.001},
  title={Addressing some of the technical challenges associated liquid phase S/TEM studies of particle, nucleation, growth and assembly},
  volume={118},
  issn={0968-4328},
  journal={Micron},
  pages={35--42},
  author={Zhu, Guomin and Reiner, Holger and Cölfen, Helmut and De Yoreo, Jim}
}
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