Investigation of thin helium films with surface bound electrons

Cieslikowski, Detlef H.; Dahm, Arnold J.; Leiderer, Paul

Investigation of thin helium films with surface bound electrons

Dateien

052_physrevlett_1987.pdf(1.14 MB)

Datum

1987

Autor:innen

Cieslikowski, Detlef H.

Dahm, Arnold J.

Leiderer, Paul

Publikationstyp

Zeitschriftenartikel

Erschienen in

Physical Review Letters ; 58 (1987), 17. - S. 1751-1754. - ISSN 0031-9007. - eISSN 1079-7114

Zusammenfassung

We have measured the mobility of electrons above 3He and 4He films condensed on a solid hydrogen substrate. Oscillations in the mobility as a function of film thickness indicate substantial layerwise adsorption of the films up to nine atomic layers. Superfluid and normal films show similar behavior.

Fachgebiet (DDC)

530 Physik

Zitieren

ISO 690

CIESLIKOWSKI, Detlef H., Arnold J. DAHM, Paul LEIDERER, 1987. Investigation of thin helium films with surface bound electrons. In: Physical Review Letters. 58(17), pp. 1751-1754. ISSN 0031-9007. eISSN 1079-7114. Available under: doi: 10.1103/PhysRevLett.58.1751

BibTex

@article{Cieslikowski1987Inves-5325,
  year={1987},
  doi={10.1103/PhysRevLett.58.1751},
  title={Investigation of thin helium films with surface bound electrons},
  number={17},
  volume={58},
  issn={0031-9007},
  journal={Physical Review Letters},
  pages={1751--1754},
  author={Cieslikowski, Detlef H. and Dahm, Arnold J. and Leiderer, Paul}
}

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