Investigation of thin helium films with surface bound electrons

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1987
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Cieslikowski, Detlef H.
Dahm, Arnold J.
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Physical Review Letters ; 58 (1987), 17. - pp. 1751-1754. - ISSN 0031-9007. - eISSN 1079-7114
Abstract
We have measured the mobility of electrons above 3He and 4He films condensed on a solid hydrogen substrate. Oscillations in the mobility as a function of film thickness indicate substantial layerwise adsorption of the films up to nine atomic layers. Superfluid and normal films show similar behavior.
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ISO 690CIESLIKOWSKI, Detlef H., Arnold J. DAHM, Paul LEIDERER, 1987. Investigation of thin helium films with surface bound electrons. In: Physical Review Letters. 58(17), pp. 1751-1754. ISSN 0031-9007. eISSN 1079-7114. Available under: doi: 10.1103/PhysRevLett.58.1751
BibTex
@article{Cieslikowski1987Inves-5325,
  year={1987},
  doi={10.1103/PhysRevLett.58.1751},
  title={Investigation of thin helium films with surface bound electrons},
  number={17},
  volume={58},
  issn={0031-9007},
  journal={Physical Review Letters},
  pages={1751--1754},
  author={Cieslikowski, Detlef H. and Dahm, Arnold J. and Leiderer, Paul}
}
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