Helium-film-induced retrapping transition in the two-dimensional electron system above an uneven solid-hydrogen surface
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A detailed theoretical analysis of the conductivity of surface electrons above a thin liquid-helium film covering an uneven solid-hydrogen surface is presented. The pronounced conductivity anomaly which is observed during the growth of the helium film is shown to originate from a strong coupling of the electrons to the roughness of the underlying hydrogen substrate. The observed conductivity anomalies (dip and peak) can be explained quantitatively by a retrapping structural transition within the disordered system of localized charges. We have measured the effects of varying electron density and discuss the influence of electronic correlation on the conductivity.
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MONARKHA, Yuri P., Uwe ALBRECHT, Kimitoshi KONO, Paul LEIDERER, 1993. Helium-film-induced retrapping transition in the two-dimensional electron system above an uneven solid-hydrogen surface. In: Physical Review B. 1993, 47(20), pp. 13812-13817. Available under: doi: 10.1103/PhysRevB.47.13812BibTex
@article{Monarkha1993Heliu-5197, year={1993}, doi={10.1103/PhysRevB.47.13812}, title={Helium-film-induced retrapping transition in the two-dimensional electron system above an uneven solid-hydrogen surface}, number={20}, volume={47}, journal={Physical Review B}, pages={13812--13817}, author={Monarkha, Yuri P. and Albrecht, Uwe and Kono, Kimitoshi and Leiderer, Paul} }
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