X-Ray Spectroscopic Investigations of Zn 0.94 Co0.06 O Thin Films
X-Ray Spectroscopic Investigations of Zn 0.94 Co0.06 O Thin Films
Lade...
Datum
2008
Autor:innen
Herausgeber:innen
ISSN der Zeitschrift
eISSN
item.preview.dc.identifier.isbn
Bibliografische Daten
Verlag
Schriftenreihe
URI (zitierfähiger Link)
DOI (zitierfähiger Link)
Internationale Patentnummer
Link zur Lizenz
EU-Projektnummer
Projekt
Open Access-Veröffentlichung
Sammlungen
Titel in einer weiteren Sprache
Publikationstyp
Zeitschriftenartikel
Publikationsstatus
Erschienen in
IEEE Transactions on Magnetics ; 44 (2008), 11. - S. 2700-2703
Zusammenfassung
We investigated Zn0.94Co0.06O thin films on sapphire (0001) substrates with respect to their structural and magnetic properties. X-ray diffraction shows a axis oriented growth and no secondary phases within its resolution. A clear improvement of the crystalline quality was obtained by post annealing under vacuum conditions. Further information about the local electronic structure is obtained by X-ray absorption spectroscopy at the Co L2,3 and the O edge. Magnetic properties were investigated with a superconducting quantum interference device (SQUID) and by X-ray magnetic circular dichroism at the Co L edg2,3e. Both techniques yield mainly paramagnetic behavior of the samples. For low temperatures, an additional small ferromagnetic contribution was observed in SQUID measurements. Several possible origins of this ferromagnetic contribution are discussed.
Zusammenfassung in einer weiteren Sprache
Fachgebiet (DDC)
530 Physik
Schlagwörter
Co-doped ZnO,diluted magnetic semiconductors,XAS,XMCD,ZnO
Konferenz
Rezension
undefined / . - undefined, undefined. - (undefined; undefined)
Zitieren
ISO 690
KILIANI, Gillian, Mikhail FONIN, Sönke VOSS, Ulrich RÜDIGER, Eberhard GOERING, 2008. X-Ray Spectroscopic Investigations of Zn 0.94 Co0.06 O Thin Films. In: IEEE Transactions on Magnetics. 44(11), pp. 2700-2703. Available under: doi: 10.1109/TMAG.2008.2003064BibTex
@article{Kiliani2008Spect-8912, year={2008}, doi={10.1109/TMAG.2008.2003064}, title={X-Ray Spectroscopic Investigations of Zn 0.94 Co0.06 O Thin Films}, number={11}, volume={44}, journal={IEEE Transactions on Magnetics}, pages={2700--2703}, author={Kiliani, Gillian and Fonin, Mikhail and Voss, Sönke and Rüdiger, Ulrich and Goering, Eberhard} }
RDF
<rdf:RDF xmlns:dcterms="http://purl.org/dc/terms/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:bibo="http://purl.org/ontology/bibo/" xmlns:dspace="http://digital-repositories.org/ontologies/dspace/0.1.0#" xmlns:foaf="http://xmlns.com/foaf/0.1/" xmlns:void="http://rdfs.org/ns/void#" xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > <rdf:Description rdf:about="https://kops.uni-konstanz.de/server/rdf/resource/123456789/8912"> <dcterms:abstract xml:lang="eng">We investigated Zn0.94Co0.06O thin films on sapphire (0001) substrates with respect to their structural and magnetic properties. X-ray diffraction shows a axis oriented growth and no secondary phases within its resolution. A clear improvement of the crystalline quality was obtained by post annealing under vacuum conditions. Further information about the local electronic structure is obtained by X-ray absorption spectroscopy at the Co L2,3 and the O edge. Magnetic properties were investigated with a superconducting quantum interference device (SQUID) and by X-ray magnetic circular dichroism at the Co L edg2,3e. Both techniques yield mainly paramagnetic behavior of the samples. For low temperatures, an additional small ferromagnetic contribution was observed in SQUID measurements. Several possible origins of this ferromagnetic contribution are discussed.</dcterms:abstract> <dcterms:issued>2008</dcterms:issued> <dc:creator>Goering, Eberhard</dc:creator> <dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/> <dc:language>eng</dc:language> <dc:contributor>Voss, Sönke</dc:contributor> <dc:format>application/pdf</dc:format> <dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/> <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-24T17:51:35Z</dc:date> <dc:contributor>Goering, Eberhard</dc:contributor> <dc:creator>Voss, Sönke</dc:creator> <dcterms:rights rdf:resource="http://creativecommons.org/licenses/by-sa/2.0/"/> <bibo:uri rdf:resource="http://kops.uni-konstanz.de/handle/123456789/8912"/> <dspace:hasBitstream rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/8912/1/IEEE_TON44_2008.pdf"/> <dc:rights>Attribution-ShareAlike 2.0 Generic</dc:rights> <dcterms:title>X-Ray Spectroscopic Investigations of Zn 0.94 Co0.06 O Thin Films</dcterms:title> <void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/> <dc:creator>Rüdiger, Ulrich</dc:creator> <foaf:homepage rdf:resource="http://localhost:8080/"/> <dc:contributor>Rüdiger, Ulrich</dc:contributor> <dcterms:bibliographicCitation>First publ. in: IEEE Transactions on Magnetics 44 (2008), 11, 2700-2703</dcterms:bibliographicCitation> <dc:creator>Kiliani, Gillian</dc:creator> <dcterms:hasPart rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/8912/1/IEEE_TON44_2008.pdf"/> <dc:contributor>Fonin, Mikhail</dc:contributor> <dc:contributor>Kiliani, Gillian</dc:contributor> <dc:creator>Fonin, Mikhail</dc:creator> <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-24T17:51:35Z</dcterms:available> </rdf:Description> </rdf:RDF>
Interner Vermerk
xmlui.Submission.submit.DescribeStep.inputForms.label.kops_note_fromSubmitter
Prüfungsdatum der Dissertation
Finanzierungsart
Kommentar zur Publikation
Allianzlizenz
Corresponding Authors der Uni Konstanz vorhanden
Internationale Co-Autor:innen
Universitätsbibliographie
Ja