An approach to spectroscopy and phase measurements in scanning plasmon near-field microscopy

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1998
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Ochmann, Michael
Münzer, Hans-Joachim
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A new optical setup for plasmon near-field optical microscopes is introduced which allows to improve the signal/background ratio independently of the wavelength used and therefore makes the spectroscopy feasible. Calculated and experimental examples demonstrate this improvement obtained by addition of ellipsometric components. Furthermore, a first measurement in combination with a scanning tunneling microscope shows it is possible to extrude phase information from this setup as well.

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530 Physik
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NFOM, spectroscopy in NFOM
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ISO 690BONEBERG, Johannes, Michael OCHMANN, Hans-Joachim MÜNZER, Paul LEIDERER, 1998. An approach to spectroscopy and phase measurements in scanning plasmon near-field microscopy. In: Ultramicroscopy. 1998, 71(1-4), pp. 345-350. Available under: doi: 10.1016/S0304-3991(97)00064-8
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@article{Boneberg1998appro-8866,
  year={1998},
  doi={10.1016/S0304-3991(97)00064-8},
  title={An approach to spectroscopy and phase measurements in scanning plasmon near-field microscopy},
  number={1-4},
  volume={71},
  journal={Ultramicroscopy},
  pages={345--350},
  author={Boneberg, Johannes and Ochmann, Michael and Münzer, Hans-Joachim and Leiderer, Paul}
}
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