Continuous Carrier-Envelope Phase Control for Terahertz-Driven Scanning Probe Microscopy of 2D Semiconductors

Lade...
Vorschaubild
Dateien
Zu diesem Dokument gibt es keine Dateien.
Datum
2023
Autor:innen
Bobzien, Laric
Huberich, Lysander
Schuler, Bruno
Herausgeber:innen
Kontakt
ISSN der Zeitschrift
Electronic ISSN
ISBN
Bibliografische Daten
Verlag
Schriftenreihe
Auflagebezeichnung
URI (zitierfähiger Link)
ArXiv-ID
Internationale Patentnummer
Angaben zur Forschungsförderung
Projekt
Open Access-Veröffentlichung
Sammlungen
Core Facility der Universität Konstanz
Gesperrt bis
Titel in einer weiteren Sprache
Publikationstyp
Beitrag zu einem Konferenzband
Publikationsstatus
Published
Erschienen in
2023 48th International Conference on Infrared, Millimeter, and Terahertz Waves : IRMMW-THz 2023 : 17-22 September 2023, Montreal, Quebec, Canada. [Piscataway, NJ]: IEEE, 2023. ISBN 979-8-3503-3660-3. Available under: doi: 10.1109/irmmw-thz57677.2023.10299310
Zusammenfassung

Defects in 2D semiconductors present an exciting materials platform to engineer atomic quantum states in a robust, yet tunable solid-state system. In this contribution, we will present our efforts to probe the dynamics of point defects in transition metal dichalcogenides (TMDs) at picosecond time and atomic spatial resolution by means of an ultrafast THz pulse driven scanning tunneling microscope (THz-STM). We demonstrate an efficient, continuous carrier-envelope phase control, which enables state-selective tunneling into specific defect orbitals in our multi-MHz repetition rate system.

Zusammenfassung in einer weiteren Sprache
Fachgebiet (DDC)
530 Physik
Schlagwörter
Konferenz
48th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 17. Sept. 2023 - 22. Sept. 2023, Montreal, QC, Canada
Rezension
undefined / . - undefined, undefined
Forschungsvorhaben
Organisationseinheiten
Zeitschriftenheft
Datensätze
Zitieren
ISO 690ALLERBECK, Jonas, Joel KUTTRUFF, Laric BOBZIEN, Lysander HUBERICH, Maxim V. TSAREV, Bruno SCHULER, 2023. Continuous Carrier-Envelope Phase Control for Terahertz-Driven Scanning Probe Microscopy of 2D Semiconductors. 48th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz). Montreal, QC, Canada, 17. Sept. 2023 - 22. Sept. 2023. In: 2023 48th International Conference on Infrared, Millimeter, and Terahertz Waves : IRMMW-THz 2023 : 17-22 September 2023, Montreal, Quebec, Canada. [Piscataway, NJ]: IEEE, 2023. ISBN 979-8-3503-3660-3. Available under: doi: 10.1109/irmmw-thz57677.2023.10299310
BibTex
@inproceedings{Allerbeck2023-09-17Conti-68993,
  year={2023},
  doi={10.1109/irmmw-thz57677.2023.10299310},
  title={Continuous Carrier-Envelope Phase Control for Terahertz-Driven Scanning Probe Microscopy of 2D Semiconductors},
  isbn={979-8-3503-3660-3},
  publisher={IEEE},
  address={[Piscataway, NJ]},
  booktitle={2023 48th International Conference on Infrared, Millimeter, and Terahertz Waves : IRMMW-THz 2023 : 17-22 September 2023, Montreal, Quebec, Canada},
  author={Allerbeck, Jonas and Kuttruff, Joel and Bobzien, Laric and Huberich, Lysander and Tsarev, Maxim V. and Schuler, Bruno}
}
RDF
<rdf:RDF
    xmlns:dcterms="http://purl.org/dc/terms/"
    xmlns:dc="http://purl.org/dc/elements/1.1/"
    xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#"
    xmlns:bibo="http://purl.org/ontology/bibo/"
    xmlns:dspace="http://digital-repositories.org/ontologies/dspace/0.1.0#"
    xmlns:foaf="http://xmlns.com/foaf/0.1/"
    xmlns:void="http://rdfs.org/ns/void#"
    xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > 
  <rdf:Description rdf:about="https://kops.uni-konstanz.de/server/rdf/resource/123456789/68993">
    <dc:creator>Tsarev, Maxim V.</dc:creator>
    <foaf:homepage rdf:resource="http://localhost:8080/"/>
    <dc:contributor>Huberich, Lysander</dc:contributor>
    <dc:contributor>Schuler, Bruno</dc:contributor>
    <dcterms:abstract>Defects in 2D semiconductors present an exciting materials platform to engineer atomic quantum states in a robust, yet tunable solid-state system. In this contribution, we will present our efforts to probe the dynamics of point defects in transition metal dichalcogenides (TMDs) at picosecond time and atomic spatial resolution by means of an ultrafast THz pulse driven scanning tunneling microscope (THz-STM). We demonstrate an efficient, continuous carrier-envelope phase control, which enables state-selective tunneling into specific defect orbitals in our multi-MHz repetition rate system.</dcterms:abstract>
    <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2024-01-10T11:52:35Z</dcterms:available>
    <dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
    <dcterms:issued>2023-09-17</dcterms:issued>
    <dc:creator>Huberich, Lysander</dc:creator>
    <dcterms:title>Continuous Carrier-Envelope Phase Control for Terahertz-Driven Scanning Probe Microscopy of 2D Semiconductors</dcterms:title>
    <dc:language>eng</dc:language>
    <bibo:uri rdf:resource="https://kops.uni-konstanz.de/handle/123456789/68993"/>
    <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2024-01-10T11:52:35Z</dc:date>
    <dc:contributor>Bobzien, Laric</dc:contributor>
    <dc:creator>Schuler, Bruno</dc:creator>
    <dc:creator>Allerbeck, Jonas</dc:creator>
    <void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/>
    <dc:contributor>Allerbeck, Jonas</dc:contributor>
    <dc:contributor>Kuttruff, Joel</dc:contributor>
    <dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
    <dc:creator>Bobzien, Laric</dc:creator>
    <dc:contributor>Tsarev, Maxim V.</dc:contributor>
    <dc:creator>Kuttruff, Joel</dc:creator>
  </rdf:Description>
</rdf:RDF>
Interner Vermerk
xmlui.Submission.submit.DescribeStep.inputForms.label.kops_note_fromSubmitter
Kontakt
URL der Originalveröffentl.
Prüfdatum der URL
Prüfungsdatum der Dissertation
Finanzierungsart
Kommentar zur Publikation
Allianzlizenz
Corresponding Authors der Uni Konstanz vorhanden
Internationale Co-Autor:innen
Universitätsbibliographie
Ja
Begutachtet
Diese Publikation teilen