Plasmon-Induced Conductance Enhancement in Single-Molecule Junctions

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2013
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Vadai, Michal
Nachman, Nirit
Ben-Zion, Matan
Selzer, Yoram
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The Journal of Physical Chemistry Letters. 2013, 4(17), pp. 2811-2816. ISSN 1948-7185. eISSN 1948-7185. Available under: doi: 10.1021/jz4014008
Zusammenfassung

The effect of surface plasmons on the conductance of single-molecule junctions is studied using a squeezable break junction setup. We show that the conductance of 2,7-diaminofluorene single-molecule junctions can be enhanced upon laser irradiation. Our experimental approach enables us to show that this enhancement is due to the plasmon-induced oscillating field within the nanoscale metal gap of the junctions. The effective plasmon field enhancement within the gap is calculated to be 1000. The experimental procedure presented in this work, which enables one to explore the coupling between plasmons and molecular excitations via transport measurements, could potentially become a valuable tool in the field of plexcitonics.

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ISO 690VADAI, Michal, Nirit NACHMAN, Matan BEN-ZION, Marius BÜRKLE, Fabian PAULY, Juan Carlos CUEVAS, Yoram SELZER, 2013. Plasmon-Induced Conductance Enhancement in Single-Molecule Junctions. In: The Journal of Physical Chemistry Letters. 2013, 4(17), pp. 2811-2816. ISSN 1948-7185. eISSN 1948-7185. Available under: doi: 10.1021/jz4014008
BibTex
@article{Vadai2013Plasm-26557,
  year={2013},
  doi={10.1021/jz4014008},
  title={Plasmon-Induced Conductance Enhancement in Single-Molecule Junctions},
  number={17},
  volume={4},
  issn={1948-7185},
  journal={The Journal of Physical Chemistry Letters},
  pages={2811--2816},
  author={Vadai, Michal and Nachman, Nirit and Ben-Zion, Matan and Bürkle, Marius and Pauly, Fabian and Cuevas, Juan Carlos and Selzer, Yoram}
}
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