Publikation:

Thickness dependence of ferromagnetic- and metal-insulator transition in thin EuO films

Vorschaubild

Dateien

Zu diesem Dokument gibt es keine Dateien.

Datum

2009

Autor:innen

Miao, Guo-Xing
Moodera, Jagadeesh S.

Herausgeber:innen

Kontakt

ISSN der Zeitschrift

Electronic ISSN

ISBN

Bibliografische Daten

Verlag

Schriftenreihe

Auflagebezeichnung

URI (zitierfähiger Link)
DOI (zitierfähiger Link)
https://doi.org/10.1063/1.3063673
ArXiv-ID

Internationale Patentnummer

Angaben zur Forschungsförderung

Projekt

Open Access-Veröffentlichung

Sammlungen

Physik: Publikationen
Core Facility der Universität Konstanz

Gesperrt bis

Titel in einer weiteren Sprache

Publikationstyp
Zeitschriftenartikel
Publikationsstatus
Published

Erschienen in

Journal of Applied Physics. American Institute of Physics AIP). 2009, 105(7), 07C917. ISSN 0021-8979. eISSN 1089-7550. Available under: doi: 10.1063/1.3063673

Zusammenfassung

We have studied the thickness dependence of the magnetic and transport properties of thin EuO films in the range of 10–60 Å. The ferromagnetic phase transition shows a systematic dependence of the critical temperature Tc with decreasing EuO film thickness. This behavior has been attributed to the interface layers which play a major role by reducing the number of average magnetic neighbors; we find the effect of interface intermixing becoming relevant in low thickness regime. In addition, we could identify a clear dependence of the onset of the metal-to-insulator transition on the ferromagnetic ordering of thin EuO films.

Zusammenfassung in einer weiteren Sprache

Fachgebiet (DDC)
530 Physik

Schlagwörter

Konferenz

Rezension
undefined / . - undefined, undefined

Forschungsvorhaben

Organisationseinheiten

Zeitschriftenheft

Zugehörige Datensätze in KOPS

Zitieren

ISO 690MÜLLER, Martina, Guo-Xing MIAO, Jagadeesh S. MOODERA, 2009. Thickness dependence of ferromagnetic- and metal-insulator transition in thin EuO films. In: Journal of Applied Physics. American Institute of Physics AIP). 2009, 105(7), 07C917. ISSN 0021-8979. eISSN 1089-7550. Available under: doi: 10.1063/1.3063673
BibTex
@article{Muller2009-04Thick-49739,
  year={2009},
  doi={10.1063/1.3063673},
  title={Thickness dependence of ferromagnetic- and metal-insulator transition in thin EuO films},
  number={7},
  volume={105},
  issn={0021-8979},
  journal={Journal of Applied Physics},
  author={Müller, Martina and Miao, Guo-Xing and Moodera, Jagadeesh S.},
  note={Article Number: 07C917}
}
RDF
<rdf:RDF
    xmlns:dcterms="http://purl.org/dc/terms/"
    xmlns:dc="http://purl.org/dc/elements/1.1/"
    xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#"
    xmlns:bibo="http://purl.org/ontology/bibo/"
    xmlns:dspace="http://digital-repositories.org/ontologies/dspace/0.1.0#"
    xmlns:foaf="http://xmlns.com/foaf/0.1/"
    xmlns:void="http://rdfs.org/ns/void#"
    xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > 
  <rdf:Description rdf:about="https://kops.uni-konstanz.de/server/rdf/resource/123456789/49739">
    <dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
    <dcterms:title>Thickness dependence of ferromagnetic- and metal-insulator transition in thin EuO films</dcterms:title>
    <foaf:homepage rdf:resource="http://localhost:8080/"/>
    <dcterms:issued>2009-04</dcterms:issued>
    <dc:creator>Müller, Martina</dc:creator>
    <dcterms:rights rdf:resource="https://rightsstatements.org/page/InC/1.0/"/>
    <dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
    <dc:creator>Miao, Guo-Xing</dc:creator>
    <dc:contributor>Müller, Martina</dc:contributor>
    <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2020-05-29T07:43:12Z</dc:date>
    <dc:creator>Moodera, Jagadeesh S.</dc:creator>
    <dcterms:abstract xml:lang="eng">We have studied the thickness dependence of the magnetic and transport properties of thin EuO films in the range of 10–60 Å. The ferromagnetic phase transition shows a systematic dependence of the critical temperature T&lt;sub&gt;c&lt;/sub&gt; with decreasing EuO film thickness. This behavior has been attributed to the interface layers which play a major role by reducing the number of average magnetic neighbors; we find the effect of interface intermixing becoming relevant in low thickness regime. In addition, we could identify a clear dependence of the onset of the metal-to-insulator transition on the ferromagnetic ordering of thin EuO films.</dcterms:abstract>
    <bibo:uri rdf:resource="https://kops.uni-konstanz.de/handle/123456789/49739"/>
    <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2020-05-29T07:43:12Z</dcterms:available>
    <dc:language>eng</dc:language>
    <dc:contributor>Moodera, Jagadeesh S.</dc:contributor>
    <dc:rights>terms-of-use</dc:rights>
    <void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/>
    <dc:contributor>Miao, Guo-Xing</dc:contributor>
  </rdf:Description>
</rdf:RDF>

Interner Vermerk

xmlui.Submission.submit.DescribeStep.inputForms.label.kops_note_fromSubmitter

Kontakt
URL der Originalveröffentl.

Prüfdatum der URL

Prüfungsdatum der Dissertation

Finanzierungsart

Kommentar zur Publikation

Allianzlizenz
Corresponding Authors der Uni Konstanz vorhanden
Internationale Co-Autor:innen
Universitätsbibliographie
Nein
Begutachtet
Ja
Diese Publikation teilen