Thickness dependence of ferromagnetic- and metal-insulator transition in thin EuO films

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2009
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Miao, Guo-Xing
Moodera, Jagadeesh S.
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Journal of Applied Physics. American Institute of Physics AIP). 2009, 105(7), 07C917. ISSN 0021-8979. eISSN 1089-7550. Available under: doi: 10.1063/1.3063673
Zusammenfassung

We have studied the thickness dependence of the magnetic and transport properties of thin EuO films in the range of 10–60 Å. The ferromagnetic phase transition shows a systematic dependence of the critical temperature Tc with decreasing EuO film thickness. This behavior has been attributed to the interface layers which play a major role by reducing the number of average magnetic neighbors; we find the effect of interface intermixing becoming relevant in low thickness regime. In addition, we could identify a clear dependence of the onset of the metal-to-insulator transition on the ferromagnetic ordering of thin EuO films.

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ISO 690MÜLLER, Martina, Guo-Xing MIAO, Jagadeesh S. MOODERA, 2009. Thickness dependence of ferromagnetic- and metal-insulator transition in thin EuO films. In: Journal of Applied Physics. American Institute of Physics AIP). 2009, 105(7), 07C917. ISSN 0021-8979. eISSN 1089-7550. Available under: doi: 10.1063/1.3063673
BibTex
@article{Muller2009-04Thick-49739,
  year={2009},
  doi={10.1063/1.3063673},
  title={Thickness dependence of ferromagnetic- and metal-insulator transition in thin EuO films},
  number={7},
  volume={105},
  issn={0021-8979},
  journal={Journal of Applied Physics},
  author={Müller, Martina and Miao, Guo-Xing and Moodera, Jagadeesh S.},
  note={Article Number: 07C917}
}
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