Signatures of two-level defects in the temperature-dependent damping of nanomechanical silicon nitride resonators

Lade...
Vorschaubild
Dateien
Zu diesem Dokument gibt es keine Dateien.
Datum
2014
Autor:innen
Faust, Thomas
Rieger, Johannes
Kotthaus, Jörg P.
Herausgeber:innen
Kontakt
ISSN der Zeitschrift
Electronic ISSN
ISBN
Bibliografische Daten
Verlag
Schriftenreihe
Auflagebezeichnung
ArXiv-ID
Internationale Patentnummer
Angaben zur Forschungsförderung
Projekt
Open Access-Veröffentlichung
Open Access Green
Sammlungen
Core Facility der Universität Konstanz
Gesperrt bis
Titel in einer weiteren Sprache
Forschungsvorhaben
Organisationseinheiten
Zeitschriftenheft
Publikationstyp
Zeitschriftenartikel
Publikationsstatus
Published
Erschienen in
Physical Review B. 2014, 89(10), 100102(R). ISSN 1098-0121. eISSN 1095-3795. Available under: doi: 10.1103/PhysRevB.89.100102
Zusammenfassung

The damping rates of high quality factor nanomechanical resonators are well beyond intrinsic limits. Here, we explore the underlying microscopic loss mechanisms by investigating the temperature-dependent damping of the fundamental and third harmonic transverse flexural mode of a doubly clamped silicon nitride string. It exhibits characteristic maxima reminiscent of two-level defects typical for amorphous materials. Coupling to those defects relaxes the momentum selection rules, allowing energy transfer from discrete long-wavelength resonator modes to the high frequency phonon environment.

Zusammenfassung in einer weiteren Sprache
Fachgebiet (DDC)
530 Physik
Schlagwörter
Konferenz
Rezension
undefined / . - undefined, undefined
Zitieren
ISO 690FAUST, Thomas, Johannes RIEGER, Maximilian SEITNER, Jörg P. KOTTHAUS, Eva M. WEIG, 2014. Signatures of two-level defects in the temperature-dependent damping of nanomechanical silicon nitride resonators. In: Physical Review B. 2014, 89(10), 100102(R). ISSN 1098-0121. eISSN 1095-3795. Available under: doi: 10.1103/PhysRevB.89.100102
BibTex
@article{Faust2014Signa-30913,
  year={2014},
  doi={10.1103/PhysRevB.89.100102},
  title={Signatures of two-level defects in the temperature-dependent damping of nanomechanical silicon nitride resonators},
  number={10},
  volume={89},
  issn={1098-0121},
  journal={Physical Review B},
  author={Faust, Thomas and Rieger, Johannes and Seitner, Maximilian and Kotthaus, Jörg P. and Weig, Eva M.},
  note={Article Number: 100102(R)}
}
RDF
<rdf:RDF
    xmlns:dcterms="http://purl.org/dc/terms/"
    xmlns:dc="http://purl.org/dc/elements/1.1/"
    xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#"
    xmlns:bibo="http://purl.org/ontology/bibo/"
    xmlns:dspace="http://digital-repositories.org/ontologies/dspace/0.1.0#"
    xmlns:foaf="http://xmlns.com/foaf/0.1/"
    xmlns:void="http://rdfs.org/ns/void#"
    xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > 
  <rdf:Description rdf:about="https://kops.uni-konstanz.de/server/rdf/resource/123456789/30913">
    <foaf:homepage rdf:resource="http://localhost:8080/"/>
    <dc:contributor>Weig, Eva M.</dc:contributor>
    <void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/>
    <dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
    <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2015-05-08T09:53:58Z</dcterms:available>
    <dcterms:rights rdf:resource="https://rightsstatements.org/page/InC/1.0/"/>
    <bibo:uri rdf:resource="http://kops.uni-konstanz.de/handle/123456789/30913"/>
    <dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
    <dc:creator>Weig, Eva M.</dc:creator>
    <dc:creator>Kotthaus, Jörg P.</dc:creator>
    <dcterms:hasPart rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/30913/1/Faust_0-288096.pdf"/>
    <dc:creator>Faust, Thomas</dc:creator>
    <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2015-05-08T09:53:58Z</dc:date>
    <dc:contributor>Faust, Thomas</dc:contributor>
    <dc:rights>terms-of-use</dc:rights>
    <dc:language>eng</dc:language>
    <dcterms:title>Signatures of two-level defects in the temperature-dependent damping of nanomechanical silicon nitride resonators</dcterms:title>
    <dc:contributor>Seitner, Maximilian</dc:contributor>
    <dcterms:issued>2014</dcterms:issued>
    <dc:creator>Seitner, Maximilian</dc:creator>
    <dc:contributor>Rieger, Johannes</dc:contributor>
    <dc:creator>Rieger, Johannes</dc:creator>
    <dc:contributor>Kotthaus, Jörg P.</dc:contributor>
    <dspace:hasBitstream rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/30913/1/Faust_0-288096.pdf"/>
    <dcterms:abstract xml:lang="eng">The damping rates of high quality factor nanomechanical resonators are well beyond intrinsic limits. Here, we explore the underlying microscopic loss mechanisms by investigating the temperature-dependent damping of the fundamental and third harmonic transverse flexural mode of a doubly clamped silicon nitride string. It exhibits characteristic maxima reminiscent of two-level defects typical for amorphous materials. Coupling to those defects relaxes the momentum selection rules, allowing energy transfer from discrete long-wavelength resonator modes to the high frequency phonon environment.</dcterms:abstract>
  </rdf:Description>
</rdf:RDF>
Interner Vermerk
xmlui.Submission.submit.DescribeStep.inputForms.label.kops_note_fromSubmitter
Kontakt
URL der Originalveröffentl.
Prüfdatum der URL
Prüfungsdatum der Dissertation
Finanzierungsart
Kommentar zur Publikation
Allianzlizenz
Corresponding Authors der Uni Konstanz vorhanden
Internationale Co-Autor:innen
Universitätsbibliographie
Ja
Begutachtet
Diese Publikation teilen