A critical duration effect in suprathreshold pattern discrimination

Parker, Denis M.; Leydel, Rita; Delius, Juan; Williams, M.

A critical duration effect in suprathreshold pattern discrimination

Dateien

Zu diesem Dokument gibt es keine Dateien.

Datum

2002

Autor:innen

Parker, Denis M.

Leydel, Rita

Delius, Juan

Williams, M.

DOI (zitierfähiger Link)

https://doi.org/10.1177/03010066020310S101

Sammlungen

Psychologie

Publikationstyp

Beitrag zu einem Konferenzband

Publikationsstatus

Published

Erschienen in

Twenty-fifth European Conference on Visual Perception (ECVP '02) : Abstract. 2002, pp. 43. Perception. 31, 1 Suppl.. ISSN 0301-0066. eISSN 1468-4233. Available under: doi: 10.1177/03010066020310S101

Zusammenfassung

The existence of critical duration effects in the integration of stimulus energy at threshold has been known since 1885 following Bloch's observations. Evidence is presented that a critical duration effect also occurs in a suprathreshold-pattern-discrimination task. Twelve observers performed a speeded, successive, 480 trial, same/different discrimination task. One of six randomly selected patterns was shown on a monitor screen for 500 ms and after a blank interval of 1200 ms was followed by a second pattern, either randomly the same or different, which was displayed for a variable duration between 20 and 1000 ms. Decision times showed a significant effect of exposure duration (F_{7, 77} = 2:65, p = 0:02), with minima occurring at 80 ms and 120 ms. Error rates were low (5%) and did not show an effect of pattern duration. In a second experiment, simple RTs to the same set of patterns at the same exposure durations were examined and a small but non- significant rise over the exposure durations from 20 ms to 120 ms was found (F_{7, 77} = 1:74, p = 0:11). It is concluded that decision times for successive same/different discriminations are fastest with exposure durations in the region of 80 - 120 ms.

Fachgebiet (DDC)

150 Psychologie

Konferenz

Twenty-fifth European Conference on Visual Perception : ECVP '02, 25. Aug. 2002 - 29. Aug. 2002, Glasgow

Zitieren

ISO 690

PARKER, Denis M., Rita LEYDEL, Juan DELIUS, M. WILLIAMS, 2002. A critical duration effect in suprathreshold pattern discrimination. Twenty-fifth European Conference on Visual Perception : ECVP '02. Glasgow, 25. Aug. 2002 - 29. Aug. 2002. In: Twenty-fifth European Conference on Visual Perception (ECVP '02) : Abstract. 2002, pp. 43. Perception. 31, 1 Suppl.. ISSN 0301-0066. eISSN 1468-4233. Available under: doi: 10.1177/03010066020310S101

BibTex

@inproceedings{Parker2002-08criti-46616,
  year={2002},
  doi={10.1177/03010066020310S101},
  title={A critical duration effect in suprathreshold pattern discrimination},
  number={31, 1 Suppl.},
  issn={0301-0066},
  series={Perception},
  booktitle={Twenty-fifth European Conference on Visual Perception (ECVP '02) : Abstract},
  author={Parker, Denis M. and Leydel, Rita and Delius, Juan and Williams, M.}
}

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