A Detailed Study on Light-Induced Degradation of Cz-Si PERC-Type Solar Cells : Evidence of Rear Surface-Related Degradation

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IEEE Journal of Photovoltaics. 2018, 8(5), pp. 1190-1201. ISSN 2156-3381. eISSN 2156-3403. Available under: doi: 10.1109/JPHOTOV.2018.2850521
Zusammenfassung

A light-induced degradation phenomenon of unknown origin in p-type Cz-Si passivated emitter and rear cell (PERC)-type solar cells is thoroughly investigated by collating results from different measurement techniques and predictions from various simulations. The observed degradation manifests in slight losses in jsc, strong losses in Voc, and devastating losses in FF, and thus massively impacts efficiency. It is found that the series resistance degrades significantly due to a degradation of front contact resistance. This, however, does not explain losses in Voc and jsc, which are attributed to the degradation of a different cell component. Neither a degradation by defect formation in the space charge region, nor the emitter, nor the bulk is found to consistently explain the observations. Only a rear surface-related degradation mechanism explains consistently all experimental findings.

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ISO 690HERGUTH, Axel, Christian DERRICKS, David SPERBER, 2018. A Detailed Study on Light-Induced Degradation of Cz-Si PERC-Type Solar Cells : Evidence of Rear Surface-Related Degradation. In: IEEE Journal of Photovoltaics. 2018, 8(5), pp. 1190-1201. ISSN 2156-3381. eISSN 2156-3403. Available under: doi: 10.1109/JPHOTOV.2018.2850521
BibTex
@article{Herguth2018-09Detai-43183,
  year={2018},
  doi={10.1109/JPHOTOV.2018.2850521},
  title={A Detailed Study on Light-Induced Degradation of Cz-Si PERC-Type Solar Cells : Evidence of Rear Surface-Related Degradation},
  number={5},
  volume={8},
  issn={2156-3381},
  journal={IEEE Journal of Photovoltaics},
  pages={1190--1201},
  author={Herguth, Axel and Derricks, Christian and Sperber, David}
}
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