Full counting statistics of multiple Andreev reflections

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Physical Review Letters. 2003, 91(18), 187001. Available under: doi: 10.1103/PhysRevLett.91.187001
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We derive the full distribution of transmitted particles through a superconducting point contact of arbitrary transparency under voltage bias. The charge transport is dominated by multiple Andreev reflections. The counting statistics is a multinomial distribution of processes, in which multiple charges ne (n = 1,2,3...) are transferred through the contact. For zero temperature we obtain analytical expressions for the probabilities of the multiple Andreev reflections. The current, shot noise, and high current cumulants in a variety of situations can be obtained from our result.

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ISO 690CUEVAS, Juan Carlos, Wolfgang BELZIG, 2003. Full counting statistics of multiple Andreev reflections. In: Physical Review Letters. 2003, 91(18), 187001. Available under: doi: 10.1103/PhysRevLett.91.187001
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@article{Cuevas2003count-9409,
  year={2003},
  doi={10.1103/PhysRevLett.91.187001},
  title={Full counting statistics of multiple Andreev reflections},
  number={18},
  volume={91},
  journal={Physical Review Letters},
  author={Cuevas, Juan Carlos and Belzig, Wolfgang},
  note={Article Number: 187001}
}
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