Publikation: Saturation effects in the phonon reflection at a quartz-liquid helium interface
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1980
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Journal of Low Temperature Physics. 1980, 39(3-4), pp. 363-372. Available under: doi: 10.1007/BF00115626
Zusammenfassung
The reflection coefficient of longitudinal 25-GHz phonons at a quartz-liquid 4He interface was measured for various phonon intensities. For thoroughly cleaned quartz surfaces a reflection coefficient of I independent of the incident intensity was found. When the sample was covered with a thin hydrocarbon film, however, the reflection coefficient dropped by typically 5-10% when the phonon intensity was low. At high intensities this extra phonon loss disappeared, suggesting the saturation of the inelastic processes at the quartzhelium interface.
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SCHUBERT, H., Paul LEIDERER, Helmut KINDER, 1980. Saturation effects in the phonon reflection at a quartz-liquid helium interface. In: Journal of Low Temperature Physics. 1980, 39(3-4), pp. 363-372. Available under: doi: 10.1007/BF00115626BibTex
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year={1980},
doi={10.1007/BF00115626},
title={Saturation effects in the phonon reflection at a quartz-liquid helium interface},
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volume={39},
journal={Journal of Low Temperature Physics},
pages={363--372},
author={Schubert, H. and Leiderer, Paul and Kinder, Helmut}
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<dcterms:abstract xml:lang="eng">The reflection coefficient of longitudinal 25-GHz phonons at a quartz-liquid 4He interface was measured for various phonon intensities. For thoroughly cleaned quartz surfaces a reflection coefficient of I independent of the incident intensity was found. When the sample was covered with a thin hydrocarbon film, however, the reflection coefficient dropped by typically 5-10% when the phonon intensity was low. At high intensities this extra phonon loss disappeared, suggesting the saturation of the inelastic processes at the quartzhelium interface.</dcterms:abstract>
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