Publikation:

Recent developments in CrystFEL

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White_0-326983.pdf
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Datum

2016

Autor:innen

White, Thomas A.
Mariani, Valerio
Yefanov, Oleksandr
Barty, Anton
Beyerlein, Kenneth R.
Chervinskii, Fedor
Yoon, Chun Hong
Chapman, Henry N.

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http://nbn-resolving.de/urn:nbn:de:bsz:352-0-326983
DOI (zitierfähiger Link)
https://doi.org/10.1107/S1600576716004751
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Biologie: Publikationen
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Published

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Journal of Applied Crystallography. 2016, 49(2), pp. 680-689. ISSN 0021-8898. eISSN 1600-5767. Available under: doi: 10.1107/S1600576716004751

Zusammenfassung

CrystFEL is a suite of programs for processing data from 'serial crystallography' experiments, which are usually performed using X-ray free-electron lasers (FELs) but also increasingly with other X-ray sources. The CrystFEL software suite has been under development since 2009, just before the first hard FEL experiments were performed, and has been significantly updated and improved since then. This article describes the most important improvements which have been made to CrystFEL since the first release version. These changes include the addition of new programs to the suite, the ability to resolve 'indexing ambiguities' and several ways to improve the quality of the integrated data by more accurately modelling the underlying diffraction physics.

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570 Biowissenschaften, Biologie

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ISO 690WHITE, Thomas A., Valerio MARIANI, Wolfgang BREHM, Oleksandr YEFANOV, Anton BARTY, Kenneth R. BEYERLEIN, Fedor CHERVINSKII, Chun Hong YOON, Kay DIEDERICHS, Henry N. CHAPMAN, 2016. Recent developments in CrystFEL. In: Journal of Applied Crystallography. 2016, 49(2), pp. 680-689. ISSN 0021-8898. eISSN 1600-5767. Available under: doi: 10.1107/S1600576716004751
BibTex
@article{White2016Recen-33989,
  year={2016},
  doi={10.1107/S1600576716004751},
  title={Recent developments in CrystFEL},
  number={2},
  volume={49},
  issn={0021-8898},
  journal={Journal of Applied Crystallography},
  pages={680--689},
  author={White, Thomas A. and Mariani, Valerio and Brehm, Wolfgang and Yefanov, Oleksandr and Barty, Anton and Beyerlein, Kenneth R. and Chervinskii, Fedor and Yoon, Chun Hong and Diederichs, Kay and Chapman, Henry N.}
}
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