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Constant dielectric loss in disordered ionic conductors : Theoretical aspects

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2009

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Maass, Philipp

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https://doi.org/10.1016/j.ssi.2008.09.027
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Solid State Ionics. Elsevier. 2009, 180(6-8), pp. 446-450. ISSN 0167-2738. eISSN 1872-7689. Available under: doi: 10.1016/j.ssi.2008.09.027

Zusammenfassung

Cooperative charge relaxation within a random system of electrostatically interacting defect centers provides a mechanism for a “nearly constant dielectric loss” (NCL) response in structurally disordered ionic conductors. Pertinent models based on statistical mechanics are reviewed briefly. In addition, we present a theoretical frame for the problem of how two kinds of ionic motion, hopping migration and NCL-type local charge relaxation, are superimposed in the total ac-response. Using renewal theory, the modification of NCL-spectra due to hopping is calculated in terms of the waiting time distribution for ionic hops. In the special case of Poissonian hops with average rate λ the modified complex dielectric susceptibility in the NCL-regime is obtained by analytic continuation from the corresponding susceptibility in the absence of hops. Implications with respect to the crossover between hopping transport and NCL-behavior are discussed.

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ISO 690DIETERICH, Wolfgang, Philipp MAASS, 2009. Constant dielectric loss in disordered ionic conductors : Theoretical aspects. In: Solid State Ionics. Elsevier. 2009, 180(6-8), pp. 446-450. ISSN 0167-2738. eISSN 1872-7689. Available under: doi: 10.1016/j.ssi.2008.09.027
BibTex
@article{Dieterich2009Const-58059,
  year={2009},
  doi={10.1016/j.ssi.2008.09.027},
  title={Constant dielectric loss in disordered ionic conductors : Theoretical aspects},
  number={6-8},
  volume={180},
  issn={0167-2738},
  journal={Solid State Ionics},
  pages={446--450},
  author={Dieterich, Wolfgang and Maass, Philipp}
}
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