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On two sample inference for eigenspaces in functional data analysis with dependent errors

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2016

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https://doi.org/10.1016/j.jspi.2016.02.001
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Journal of Statistical Planning and Inference. 2016, 174, pp. 20-37. ISSN 0378-3758. eISSN 0378-3758. Available under: doi: 10.1016/j.jspi.2016.02.001

Zusammenfassung

We consider functional data analysis for randomly perturbed repeated time series with a general dependence structure of the error process. Specifically, the question of testing for equality of subspaces spanned by a finite number of eigenfunctions is addressed. The asymptotic distribution of standardized residual processes based on projections of eigenfunctions is derived. A two-sample test based on the residual processes is proposed together with a nuisance parameter free bootstrap procedure. Simulations illustrate finite sample properties.

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510 Mathematik

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ISO 690BERAN, Jan, Haiyan LIU, Klaus TELKMANN, 2016. On two sample inference for eigenspaces in functional data analysis with dependent errors. In: Journal of Statistical Planning and Inference. 2016, 174, pp. 20-37. ISSN 0378-3758. eISSN 0378-3758. Available under: doi: 10.1016/j.jspi.2016.02.001
BibTex
@article{Beran2016sampl-34332,
  year={2016},
  doi={10.1016/j.jspi.2016.02.001},
  title={On two sample inference for eigenspaces in functional data analysis with dependent errors},
  volume={174},
  issn={0378-3758},
  journal={Journal of Statistical Planning and Inference},
  pages={20--37},
  author={Beran, Jan and Liu, Haiyan and Telkmann, Klaus}
}
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