Publikation: Strain engineering for transition-metal defects in SiC
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Transition metal (TM) defects in silicon carbide (SiC) are a promising platform for applications in quantum technology as some of these defects, e.g., vanadium (V), allow for optical emission in one of the telecom bands. For other defects, it was shown that straining the crystal can lead to beneficial effects regarding the emission properties. Motivated by this, we theoretically study the main effects of strain on the electronic-level structure and optical electric-dipole transitions of the V defect in SiC. In particular, we show how strain can be used to engineer the đť‘” tensor, electronic selection rules, and the hyperfine interaction. Based on these insights, we discuss optical Lambda systems and a path forward to initializing the quantum state of strained TM defects in SiC.
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TISSOT, Benedikt, PĂ©ter UDVARHELYI, Adam GALI, Guido BURKARD, 2024. Strain engineering for transition-metal defects in SiC. In: Physical Review B. American Physical Society (APS). 2024, 109(5), 054111. ISSN 2469-9950. eISSN 2469-9969. VerfĂĽgbar unter: doi: 10.1103/physrevb.109.054111BibTex
@article{Tissot2024-02-20Strai-71394, year={2024}, doi={10.1103/physrevb.109.054111}, title={Strain engineering for transition-metal defects in SiC}, number={5}, volume={109}, issn={2469-9950}, journal={Physical Review B}, author={Tissot, Benedikt and Udvarhelyi, PĂ©ter and Gali, Adam and Burkard, Guido}, note={Article Number: 054111} }
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