Publikation: Overlapping XAFS L spectra of 3d metals : a new application of the regularization method
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L XAFS spectra of polycrystalline Fe and Cr films are investigated by EXAFS and TEY (Total Electron Yield) techniques. A new method of obtaining local structure information from overlapping L XAFS spectra for 3d metals is proposed. Tikhonov regularization method of solving ill-posed problem is used. In contrast to the conventional methods (Fourier transformation and fitting procedures) this method does not demand any model assumption and any special procedure of deconvolution of L1 , L2 , L3 contributions. The parameters obtained from L XAFS spectra of polycrystalline Fe and Cr films (interatomic distance and coordination number for the first and the second coordination shells) agree with the expected crystallographic values. Up to now the regularization method was applied only to nonoverlapping XAFS spectra.
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BABANOV, Yuri, S. KIRYANOV, A. SIDORENKO, L. ROMASHEV, Denis V. VYALIKH, Serguei MOLODTSOV, Gernot GÜNTHERODT, Ulrich RÜDIGER, Yuriy S. DEDKOV, Mikhail FONIN, Klaus BABERSCHKE, Heiko WENDE, Yves U. IDZERDA, 2005. Overlapping XAFS L spectra of 3d metals : a new application of the regularization method. In: Physica Scripta / Topical Issues. 2005, T115, pp. 194-196. Available under: doi: 10.1238/Physica.Topical.115a00194BibTex
@article{Babanov2005Overl-9436, year={2005}, doi={10.1238/Physica.Topical.115a00194}, title={Overlapping XAFS L spectra of 3d metals : a new application of the regularization method}, volume={T115}, journal={Physica Scripta / Topical Issues}, pages={194--196}, author={Babanov, Yuri and Kiryanov, S. and Sidorenko, A. and Romashev, L. and Vyalikh, Denis V. and Molodtsov, Serguei and Güntherodt, Gernot and Rüdiger, Ulrich and Dedkov, Yuriy S. and Fonin, Mikhail and Baberschke, Klaus and Wende, Heiko and Idzerda, Yves U.} }
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