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Surface excitations in thin helium films on silica aerogel

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2002

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Lauter, Hans J.
Bogoyavlenskii, I. V.
Puchkov, Alexander. V.
Godfrin, Henri
Skomorokhov, Andrei
Klier, Jürgen

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Applied Physics / A, Materials Science and Processing. 2002, 74(Supplement 1), pp. 1547-1549. Available under: doi: 10.1007/s003390201774

Zusammenfassung

First measurements are reported on pure surface excitations in thin superfluid 4He films on silica aerogel. The ripplon dispersion curve is found to be the same for helium on graphite and silica aerogel substrates. However, the layered roton line width in helium films on aerogel shows a pronounced broadening with respect to that found in helium films on graphite.

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530 Physik

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ISO 690LAUTER, Hans J., I. V. BOGOYAVLENSKII, Alexander. V. PUCHKOV, Henri GODFRIN, Andrei SKOMOROKHOV, Jürgen KLIER, Paul LEIDERER, 2002. Surface excitations in thin helium films on silica aerogel. In: Applied Physics / A, Materials Science and Processing. 2002, 74(Supplement 1), pp. 1547-1549. Available under: doi: 10.1007/s003390201774
BibTex
@article{Lauter2002Surfa-4752,
  year={2002},
  doi={10.1007/s003390201774},
  title={Surface excitations in thin helium films on silica aerogel},
  number={Supplement 1},
  volume={74},
  journal={Applied Physics / A, Materials Science and Processing},
  pages={1547--1549},
  author={Lauter, Hans J. and Bogoyavlenskii, I. V. and Puchkov, Alexander. V. and Godfrin, Henri and Skomorokhov, Andrei and Klier, Jürgen and Leiderer, Paul}
}
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