Publikation:

Influence of tip-sample interaction in a time-domain terahertz scattering near field scanning microscope

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APL_thoma_2008.pdf
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2008

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http://nbn-resolving.de/urn:nbn:de:bsz:352-opus-75494
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https://doi.org/10.1063/1.2949858
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Applied Physics Letters. 2008, 92, 251103. Available under: doi: 10.1063/1.2949858

Zusammenfassung

Apertureless near field measurements with a metallic tip are performed in the terahertz frequency range. Lateral scans are recorded for different time delays within a terahertz pulse. The forward scattered terahertz signal strongly depends on the time delay. At larger time delays, the tip-sample interaction leads to additional structures in the scan that do not correspond to a change in topography or dielectric function.

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530 Physik

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ISO 690THOMA, Arne, Thomas DEKORSY, 2008. Influence of tip-sample interaction in a time-domain terahertz scattering near field scanning microscope. In: Applied Physics Letters. 2008, 92, 251103. Available under: doi: 10.1063/1.2949858
BibTex
@article{Thoma2008Influ-9470,
  year={2008},
  doi={10.1063/1.2949858},
  title={Influence of tip-sample interaction in a time-domain terahertz scattering near field scanning microscope},
  volume={92},
  journal={Applied Physics Letters},
  author={Thoma, Arne and Dekorsy, Thomas},
  note={Article Number: 251103}
}
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