Antiferromagnetic layer thickness dependence of the IrMn/Co exchange-bias system

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2003
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Ali, Mannan
Marrows, Christopher H.
Al-Jawad, M.
Hickey, Bryan J.
Misra, Arkajyoti
Usadel, Klaus-Dieter
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Physical Review B. 2003, 68, 214420. Available under: doi: 10.1103/PhysRevB.68.214420
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A study of exchange bias in IrMn/Co systems is presented. Temperature and thickness dependence studies have revealed nonmonotonic behavior in both exchange bias field and coercivity with both variables. In particular the exchange bias field shows a peak for low IrMn thicknesses that is suppressed at temperatures higher than about 200 K. Calculations using the domain state model of exchange biasing are able to describe all the features seen in the experimental data.

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ISO 690ALI, Mannan, Christopher H. MARROWS, M. AL-JAWAD, Bryan J. HICKEY, Arkajyoti MISRA, Ulrich NOWAK, Klaus-Dieter USADEL, 2003. Antiferromagnetic layer thickness dependence of the IrMn/Co exchange-bias system. In: Physical Review B. 2003, 68, 214420. Available under: doi: 10.1103/PhysRevB.68.214420
BibTex
@article{Ali2003Antif-4877,
  year={2003},
  doi={10.1103/PhysRevB.68.214420},
  title={Antiferromagnetic layer thickness dependence of the IrMn/Co exchange-bias system},
  volume={68},
  journal={Physical Review B},
  author={Ali, Mannan and Marrows, Christopher H. and Al-Jawad, M. and Hickey, Bryan J. and Misra, Arkajyoti and Nowak, Ulrich and Usadel, Klaus-Dieter},
  note={Article Number: 214420}
}
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