@article{Buonassisi2005Quant-31408,
  year={2005},
  doi={10.1063/1.1997274},
  title={Quantifying the effect of metal-rich precipitates on minority carrier diffusion length in multicrystalline silicon using synchrotron-based spectrally resolved x-ray beam-induced current},
  number={4},
  volume={87},
  issn={0003-6951},
  journal={Applied Physics Letters},
  author={Buonassisi, Tonio and Istratov, Andrei A. and Pickett, Matthew D. and Marcus, Matthew A. and Hahn, Giso and Riepe, Stephan and Isenberg, Jörg and Warta, Wilhelm and Willeke, Gerd and Ciszek, Ted F. and Weber, Eicke R.},
  note={Article Number: 044101}
}

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