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Simulation Study on the Concept of Lifetime-Equivalent Defect Density in the Context of Light-Induced Degradation (LID) Experiments

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2019

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https://doi.org/10.1109/PVSC40753.2019.8981263
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2019 IEEE 46th Photovoltaic Specialists Conference (PVSC). Piscataway, NJ: IEEE, 2019, pp. 54-60. ISSN 0160-8371. ISBN 978-1-72810-494-2. Available under: doi: 10.1109/PVSC40753.2019.8981263

Zusammenfassung

The concept of lifetime-equivalent defect density in the context of light-induced degradation investigation is evaluated by means of simulations especially in cases where more than one defect species changes over time. The superposition of boron-oxygen related light-induced degradation (BO-LID) with light- and elevated temperature-induced degradation (LeTID) as well as FeB dissociation as found in reality is discussed. Furthermore, the effect of varying background lifetime, as often encountered in the context of LeTID in mc-Si, and varying Fe density is studied.

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530 Physik

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defect kinetics, LID, BO-LID, LeTID, FeB

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2019 IEEE 46th Photovoltaic Specialists Conference (PVSC), 16. Juni 2019 - 21. Juni 2019, Chicago, IL, USA
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ISO 690HERGUTH, Axel, 2019. Simulation Study on the Concept of Lifetime-Equivalent Defect Density in the Context of Light-Induced Degradation (LID) Experiments. 2019 IEEE 46th Photovoltaic Specialists Conference (PVSC). Chicago, IL, USA, 16. Juni 2019 - 21. Juni 2019. In: 2019 IEEE 46th Photovoltaic Specialists Conference (PVSC). Piscataway, NJ: IEEE, 2019, pp. 54-60. ISSN 0160-8371. ISBN 978-1-72810-494-2. Available under: doi: 10.1109/PVSC40753.2019.8981263
BibTex
@inproceedings{Herguth2019Simul-51473,
  year={2019},
  doi={10.1109/PVSC40753.2019.8981263},
  title={Simulation Study on the Concept of Lifetime-Equivalent Defect Density in the Context of Light-Induced Degradation (LID) Experiments},
  isbn={978-1-72810-494-2},
  issn={0160-8371},
  publisher={IEEE},
  address={Piscataway, NJ},
  booktitle={2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)},
  pages={54--60},
  author={Herguth, Axel}
}
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