Measurement of surface charge densities on Brownian particles using total internal reflection microscopy

dc.contributor.authorvon Grünberg, Hans-Hennigdeu
dc.contributor.authorHelden, Laurentdeu
dc.contributor.authorLeiderer, Paul
dc.contributor.authorBechinger, Clemens
dc.date.accessioned2011-03-24T17:52:59Zdeu
dc.date.available2011-03-24T17:52:59Zdeu
dc.date.issued2001deu
dc.description.abstractDue to double-layer forces a charged colloid suspended in an electrolyte is repelled from a like-charged planar wall. We demonstrate that and how a precise measurement of these double-layer forces acting on a colloid near a glass surface can be used to determine surface charge densities. The effective wall colloid potentials are measured using the total internal reflection microscopy technique, and a whole series of such potentials, taken for various different salt concentrations, are then analysed in terms of a given theoretical interaction potential, where the surface charge densities are the only unknown parameters. We find reasonable values for the surface charge densities of silica and polystyrene spheres in water, and compare the proposed method with other more established techniques to measure surface charge densities on single particles.eng
dc.description.versionpublished
dc.format.mimetypeapplication/pdfdeu
dc.identifier.citationFirst publ. in: Journal of Chemical Physics 114 (2001), 22, pp. 10094-10104deu
dc.identifier.doi10.1063/1.1371556
dc.identifier.ppn264913450deu
dc.identifier.urihttp://kops.uni-konstanz.de/handle/123456789/9030
dc.language.isoengdeu
dc.legacy.dateIssued2007deu
dc.rightsAttribution-NonCommercial-NoDerivs 2.0 Generic
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/
dc.subject.ddc530deu
dc.titleMeasurement of surface charge densities on Brownian particles using total internal reflection microscopyeng
dc.typeJOURNAL_ARTICLEdeu
dspace.entity.typePublication
kops.citation.bibtex
@article{vonGrunberg2001Measu-9030,
  year={2001},
  doi={10.1063/1.1371556},
  title={Measurement of surface charge densities on Brownian particles using total internal reflection microscopy},
  number={22},
  volume={114},
  issn={0021-9606},
  journal={Journal of Chemical Physics},
  pages={10094--10104},
  author={von Grünberg, Hans-Hennig and Helden, Laurent and Leiderer, Paul and Bechinger, Clemens}
}
kops.citation.iso690VON GRÜNBERG, Hans-Hennig, Laurent HELDEN, Paul LEIDERER, Clemens BECHINGER, 2001. Measurement of surface charge densities on Brownian particles using total internal reflection microscopy. In: Journal of Chemical Physics. 2001, 114(22), pp. 10094-10104. ISSN 0021-9606. eISSN 1089-7690. Available under: doi: 10.1063/1.1371556deu
kops.citation.iso690VON GRÜNBERG, Hans-Hennig, Laurent HELDEN, Paul LEIDERER, Clemens BECHINGER, 2001. Measurement of surface charge densities on Brownian particles using total internal reflection microscopy. In: Journal of Chemical Physics. 2001, 114(22), pp. 10094-10104. ISSN 0021-9606. eISSN 1089-7690. Available under: doi: 10.1063/1.1371556eng
kops.citation.rdf
<rdf:RDF
    xmlns:dcterms="http://purl.org/dc/terms/"
    xmlns:dc="http://purl.org/dc/elements/1.1/"
    xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#"
    xmlns:bibo="http://purl.org/ontology/bibo/"
    xmlns:dspace="http://digital-repositories.org/ontologies/dspace/0.1.0#"
    xmlns:foaf="http://xmlns.com/foaf/0.1/"
    xmlns:void="http://rdfs.org/ns/void#"
    xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > 
  <rdf:Description rdf:about="https://kops.uni-konstanz.de/server/rdf/resource/123456789/9030">
    <dc:rights>Attribution-NonCommercial-NoDerivs 2.0 Generic</dc:rights>
    <dc:creator>Leiderer, Paul</dc:creator>
    <dspace:hasBitstream rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/9030/1/293_jcph_2001.pdf"/>
    <dc:contributor>Bechinger, Clemens</dc:contributor>
    <dc:format>application/pdf</dc:format>
    <dcterms:abstract xml:lang="eng">Due to double-layer forces a charged colloid suspended in an electrolyte is repelled from a like-charged planar wall. We demonstrate that and how a precise measurement of these double-layer forces acting on a colloid near a glass surface can be used to determine surface charge densities. The effective wall colloid potentials are measured using the total internal reflection microscopy technique, and a whole series of such potentials, taken for various different salt concentrations, are then analysed in terms of a given theoretical interaction potential, where the surface charge densities are the only unknown parameters. We find reasonable values for the surface charge densities of silica and polystyrene spheres in water, and compare the proposed method with other more established techniques to measure surface charge densities on single particles.</dcterms:abstract>
    <dcterms:rights rdf:resource="http://creativecommons.org/licenses/by-nc-nd/2.0/"/>
    <foaf:homepage rdf:resource="http://localhost:8080/"/>
    <dc:contributor>Leiderer, Paul</dc:contributor>
    <void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/>
    <dc:contributor>Helden, Laurent</dc:contributor>
    <dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
    <dc:creator>Helden, Laurent</dc:creator>
    <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-24T17:52:59Z</dcterms:available>
    <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-24T17:52:59Z</dc:date>
    <dc:creator>von Grünberg, Hans-Hennig</dc:creator>
    <dc:contributor>von Grünberg, Hans-Hennig</dc:contributor>
    <dcterms:hasPart rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/9030/1/293_jcph_2001.pdf"/>
    <dcterms:bibliographicCitation>First publ. in: Journal of Chemical Physics 114 (2001), 22, pp. 10094-10104</dcterms:bibliographicCitation>
    <dcterms:title>Measurement of surface charge densities on Brownian particles using total internal reflection microscopy</dcterms:title>
    <dcterms:issued>2001</dcterms:issued>
    <dc:creator>Bechinger, Clemens</dc:creator>
    <dc:language>eng</dc:language>
    <dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
    <bibo:uri rdf:resource="http://kops.uni-konstanz.de/handle/123456789/9030"/>
  </rdf:Description>
</rdf:RDF>
kops.description.openAccessopenaccessgreen
kops.flag.knbibliographyfalse
kops.identifier.nbnurn:nbn:de:bsz:352-opus-28319deu
kops.opus.id2831deu
kops.sourcefieldJournal of Chemical Physics. 2001, <b>114</b>(22), pp. 10094-10104. ISSN 0021-9606. eISSN 1089-7690. Available under: doi: 10.1063/1.1371556deu
kops.sourcefield.plainJournal of Chemical Physics. 2001, 114(22), pp. 10094-10104. ISSN 0021-9606. eISSN 1089-7690. Available under: doi: 10.1063/1.1371556deu
kops.sourcefield.plainJournal of Chemical Physics. 2001, 114(22), pp. 10094-10104. ISSN 0021-9606. eISSN 1089-7690. Available under: doi: 10.1063/1.1371556eng
relation.isAuthorOfPublication611eb991-101f-4ad3-95e8-a31e03018c51
relation.isAuthorOfPublication37778d1a-fdea-43ea-ae7d-92b6a9985710
relation.isAuthorOfPublication.latestForDiscovery611eb991-101f-4ad3-95e8-a31e03018c51
source.bibliographicInfo.fromPage10094
source.bibliographicInfo.issue22
source.bibliographicInfo.toPage10104
source.bibliographicInfo.volume114
source.identifier.eissn1089-7690
source.identifier.issn0021-9606
source.periodicalTitleJournal of Chemical Physics

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