Publikation: Quality Metrics for Symmetric Graph Drawings
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2020
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BECK, Fabian, ed. and others. 2020 IEEE Pacific Visualization Symposium (PacificVis) : Proceedings. Piscataway, NJ: IEEE, 2020, pp. 11-15. ISSN 2165-8765. eISSN 2165-8773. ISBN 978-1-72815-697-2. Available under: doi: 10.1109/PacificVis48177.2020.1022
Zusammenfassung
In this paper, we present a framework for quality metrics that measure symmetry, that is, how faithfully a drawing of a graph displays the ground truth geometric automorphisms as symmetries. The quality metrics are based on group theory as well as geometry. More specifically, we introduce two types of symmetry quality metrics for displaying: (1) a single geometric automorphism as a symmetry (axial or rotational) and (2) a group of geometric automorphisms (cyclic or dihedral). We also present algorithms to compute the symmetry quality metrics in O(n log n) time. We validate our symmetry quality metrics using deformation experiments. We then use the metrics to evaluate existing graph layouts to compare how faithfully they display geometric automorphisms of a graph as symmetries.
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004 Informatik
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Human-centered computing, Visualization, Visualization techniques, Graph drawing, Visualization design and evaluation methods
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2020 IEEE Pacific Visualization Symposium (PacificVis), 3. Juni 2020 - 5. Juni 2020, Tianjin, China
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MEIDIANA, Amyra, Seok-Hee HONG, Peter EADES, Daniel A. KEIM, 2020. Quality Metrics for Symmetric Graph Drawings. 2020 IEEE Pacific Visualization Symposium (PacificVis). Tianjin, China, 3. Juni 2020 - 5. Juni 2020. In: BECK, Fabian, ed. and others. 2020 IEEE Pacific Visualization Symposium (PacificVis) : Proceedings. Piscataway, NJ: IEEE, 2020, pp. 11-15. ISSN 2165-8765. eISSN 2165-8773. ISBN 978-1-72815-697-2. Available under: doi: 10.1109/PacificVis48177.2020.1022BibTex
@inproceedings{Meidiana2020Quali-52199,
year={2020},
doi={10.1109/PacificVis48177.2020.1022},
title={Quality Metrics for Symmetric Graph Drawings},
isbn={978-1-72815-697-2},
issn={2165-8765},
publisher={IEEE},
address={Piscataway, NJ},
booktitle={2020 IEEE Pacific Visualization Symposium (PacificVis) : Proceedings},
pages={11--15},
editor={Beck, Fabian},
author={Meidiana, Amyra and Hong, Seok-Hee and Eades, Peter and Keim, Daniel A.}
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