Publikation:

Nondestructive Characterization of Voids in Rear Local Contacts of PERC-Type Solar Cells

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Dressler_0-277535.pdf
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2015

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Rauer, Miriam
Kaloudis, Michael
Dauwe, Stefan

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IEEE Journal of Photovoltaics. 2015, 5(1), pp. 70-76. ISSN 2156-3381. Available under: doi: 10.1109/JPHOTOV.2014.2359745

Zusammenfassung

In this paper, we present two nondestructive characterization methods for the detection of voids in rear local contacts of passivated emitter and rear-type solar cells, namely scanning acoustic microscopy and computer tomography. We compare both methods and include a comparison with electroluminescence measurements. It is shown in this paper that voids can easily be detected with both measurement types without any sample preparation. We found a good match of scanning acoustic microscopy (SAM) and computer tomography (CT), which is presented for this purpose for the first time. The investigation was carried out for different aluminum pastes.

Zusammenfassung in einer weiteren Sprache

Fachgebiet (DDC)
530 Physik

Schlagwörter

Computer tomography (CT), crystalline silicon, passivated emitter and rear cell concept (PERC), scanning acoustic microscopy (SAM), solar cells, voids

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ISO 690DRESSLER, Katharina, Miriam RAUER, Michael KALOUDIS, Stefan DAUWE, Axel HERGUTH, Giso HAHN, 2015. Nondestructive Characterization of Voids in Rear Local Contacts of PERC-Type Solar Cells. In: IEEE Journal of Photovoltaics. 2015, 5(1), pp. 70-76. ISSN 2156-3381. Available under: doi: 10.1109/JPHOTOV.2014.2359745
BibTex
@article{Dressler2015Nonde-30732,
  year={2015},
  doi={10.1109/JPHOTOV.2014.2359745},
  title={Nondestructive Characterization of Voids in Rear Local Contacts of PERC-Type Solar Cells},
  number={1},
  volume={5},
  issn={2156-3381},
  journal={IEEE Journal of Photovoltaics},
  pages={70--76},
  author={Dressler, Katharina and Rauer, Miriam and Kaloudis, Michael and Dauwe, Stefan and Herguth, Axel and Hahn, Giso}
}
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