Magnetoresistance, micromagnetism, and domain-wall scattering in epitaxial hcp Co films

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1999
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Yu, Jun
Kent, Andrew D.
Thomas, Luc
Parkin, Stuart S. P.
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Physical Review B ; 59 (1999), 18. - pp. 11914-11918
Abstract
Large negative magnetoresistance (MR) observed in transport measurements of hcp Co films with stripe domains were recently reported and interpreted in terms of domain-wall (DW) scattering mechanism. Here detailed MR measurements, magnetic force microscopy, and micromagnetic calculations are combined to elucidate the origin of MR in this material. The large negative room-temperature MR reported previously is shown to be due to ferromagnetic resistivity anisotropy. Measurements of the resistivity for currents parallel (CIW) and perpendicular to DW s (CPW) have been conducted as a function of temperature. Low-temperature results show that any intrinsic effect of DW s scattering on MR of this material is very small compared to the anisotropic MR.
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Cite This
ISO 690RÜDIGER, Ulrich, Jun YU, Andrew D. KENT, Luc THOMAS, Stuart S. P. PARKIN, 1999. Magnetoresistance, micromagnetism, and domain-wall scattering in epitaxial hcp Co films. In: Physical Review B. 59(18), pp. 11914-11918. Available under: doi: 10.1103/PhysRevB.59.11914
BibTex
@article{Rudiger1999Magne-9280,
  year={1999},
  doi={10.1103/PhysRevB.59.11914},
  title={Magnetoresistance, micromagnetism, and domain-wall scattering in epitaxial hcp Co films},
  number={18},
  volume={59},
  journal={Physical Review B},
  pages={11914--11918},
  author={Rüdiger, Ulrich and Yu, Jun and Kent, Andrew D. and Thomas, Luc and Parkin, Stuart S. P.}
}
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