Publikation:

Revealing thermal effects in the electronic transport through irradiated atomic metal point contacts

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2012

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Beilstein Journal of Nanotechnology. 2012, 3, pp. 703-711. ISSN 2190-4286. eISSN 2190-4286. Available under: doi: 10.3762/bjnano.3.80

Zusammenfassung

We report on the electronic transport through nanoscopic metallic contacts under the influence of external light fields. Various processes can be of relevance here, whose underlying mechanisms can be studied by comparing different kinds of atomic contacts. For this purpose two kinds of contacts, which were established by electrochemical deposition, forming a gate-controlled quantum switch (GCQS), have been studied. We demonstrate that in these kinds of contacts thermal effects resulting from local heating due to the incident light, namely thermovoltage and the temperature dependences of the electrical resistivity and the electrochemical (Helmholtz) double layer are the most prominent effects.

Zusammenfassung in einer weiteren Sprache

Fachgebiet (DDC)
530 Physik

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atom transistor, atomic contacts, cyclic voltammogram, electrochemically closed break junction, electronic transport, (Helmholtz) double layer, light-induced signals, temperature-induced changes, thermovoltage

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ISO 690KOPP, Bastian, Zhiwei YI, Daniel BENNER, Fang-Qing XIE, Christian OBERMAIR, Thomas SCHIMMEL, Johannes BONEBERG, Paul LEIDERER, Elke SCHEER, 2012. Revealing thermal effects in the electronic transport through irradiated atomic metal point contacts. In: Beilstein Journal of Nanotechnology. 2012, 3, pp. 703-711. ISSN 2190-4286. eISSN 2190-4286. Available under: doi: 10.3762/bjnano.3.80
BibTex
@article{Kopp2012Revea-20833,
  year={2012},
  doi={10.3762/bjnano.3.80},
  title={Revealing thermal effects in the electronic transport through irradiated atomic metal point contacts},
  volume={3},
  issn={2190-4286},
  journal={Beilstein Journal of Nanotechnology},
  pages={703--711},
  author={Kopp, Bastian and Yi, Zhiwei and Benner, Daniel and Xie, Fang-Qing and Obermair, Christian and Schimmel, Thomas and Boneberg, Johannes and Leiderer, Paul and Scheer, Elke}
}
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