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Reversible laser annealing and magneto-optical characterization of HTSC thin films

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1999

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Eisenmenger, Johannes
Zimmermann, Jörg
Schiessling, Joachim
Bolz, Uwe

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Advances in Solid State Physics. 1999, 39, pp. 413-422. Available under: doi: 10.1007/BFb0107498

Zusammenfassung

The oxygen content in YBCO thin films can be changed locally by scanning a focused laser beam across the film surface at defined oxygen partial pressure. In contrast to annealing experiments in a furnace where the oxygen concentration remains homogeneous in the direction of the film layer, the local heating with a laser beam leads also to a lateral oxygen diffusion in the thin film. By investigating the laser written structures a deeper understanding of the patterning process itself and the oxygen diffusion in YBCO thin films could be obtained. For the detection of laser written structures and natural defects in HTSC thin films the magneto-optical method is highly qualified. It allows to visualize the magnetic screening behaviour with a high lateral resolution in the range of micrometers. In the past this technique was used to investigate the magnetic flux distribution in smaller samples at temperatures far below the boiling point of liquid nitrogen. In this work the magnetic resolution of the method was optimized so that much weaker magnetic field contrasts at 77 K can still be detected. In particular the presented apparatus allows the characterization of double-sided 3" HTSC Wafers even under conditions where cooling with liquid helium or closed-cycle refrigerators is not available.

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ISO 690EISENMENGER, Johannes, Jörg ZIMMERMANN, Joachim SCHIESSLING, Uwe BOLZ, Bernd-Uwe RUNGE, Paul LEIDERER, 1999. Reversible laser annealing and magneto-optical characterization of HTSC thin films. In: Advances in Solid State Physics. 1999, 39, pp. 413-422. Available under: doi: 10.1007/BFb0107498
BibTex
@article{Eisenmenger1999Rever-9050,
  year={1999},
  doi={10.1007/BFb0107498},
  title={Reversible laser annealing and magneto-optical characterization of HTSC thin films},
  volume={39},
  journal={Advances in Solid State Physics},
  pages={413--422},
  author={Eisenmenger, Johannes and Zimmermann, Jörg and Schiessling, Joachim and Bolz, Uwe and Runge, Bernd-Uwe and Leiderer, Paul}
}
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