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Time-resolved measurements of the response of a STM tip upon illumination with a nanosecond laser pulse

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218_applph_1998.pdf
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1998

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Tresp, Michael
Ochmann, Michael
Münzer, Hans-Joachim

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Applied Physics / A, Materials Science and Processing. 1998, 66(6), pp. 615-619. Available under: doi: 10.1007/s003390050722

Zusammenfassung

Nanosecond laser pulses are used to illuminate the very end of a tip of a scanning tunneling microscope in front of a gold surface. The transient increase of the tunneling current is measured as a function of the pulse energy density, tip retraction amplitude, polarization of the incident light, and bias voltage. The transient signal has a typical timescale of ms. Thus it can be concluded that the thermal expansion of the tip is responsible for this signal. The expansion has a linear dependence on the incident light intensity with a typical value of the order of 0.1 Å /(mJ/cm2). This result demands a critical inspection of the interpretation of nanostructuring experiments with this technique.

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ISO 690BONEBERG, Johannes, Michael TRESP, Michael OCHMANN, Hans-Joachim MÜNZER, Paul LEIDERER, 1998. Time-resolved measurements of the response of a STM tip upon illumination with a nanosecond laser pulse. In: Applied Physics / A, Materials Science and Processing. 1998, 66(6), pp. 615-619. Available under: doi: 10.1007/s003390050722
BibTex
@article{Boneberg1998Timer-9523,
  year={1998},
  doi={10.1007/s003390050722},
  title={Time-resolved measurements of the response of a STM tip upon illumination with a nanosecond laser pulse},
  number={6},
  volume={66},
  journal={Applied Physics / A, Materials Science and Processing},
  pages={615--619},
  author={Boneberg, Johannes and Tresp, Michael and Ochmann, Michael and Münzer, Hans-Joachim and Leiderer, Paul}
}
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