Publikation: Minimizing the electrical losses on the front side: development of a selective emitter process from a single diffusion
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In this paper we present latest results in the development of a process for the abrication of a selective emitter structure on mono- and multicrystalline silicon solar cells. The process is based on an approach that was first introduced by Zerga et al. [1]. We have chosen a wet chemical route for an emitter etch back where the areas of the wafer that are intended for emitter metallization are shielded from etching by a screen printable etch barrier. The etch barrier is later removed by wet chemical etching. The process has yielded a gain in open circuit voltage of more than 1% and a gain in short circuit current of more than 2%. The overall efficiency gain was more than 0.3%abs due to slightly lower fill factor of the cells.
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HAVERKAMP, Helge, Amir DASTGHEIB-SHIRAZI, Bernd RAABE, Felix BOOK, Giso HAHN, 2008. Minimizing the electrical losses on the front side: development of a selective emitter process from a single diffusion. 2008 33rd IEEE Photovolatic Specialists Conference (PVSC). San Diego, CA, USA, 11. Mai 2008 - 16. Mai 2008. In: 2008 33rd IEEE Photovolatic Specialists Conference. IEEE, 2008, pp. 1-4. ISSN 0160-8371. ISBN 978-1-4244-1640-0. Available under: doi: 10.1109/PVSC.2008.4922443BibTex
@inproceedings{Haverkamp2008-05Minim-838, year={2008}, doi={10.1109/PVSC.2008.4922443}, title={Minimizing the electrical losses on the front side: development of a selective emitter process from a single diffusion}, isbn={978-1-4244-1640-0}, issn={0160-8371}, publisher={IEEE}, booktitle={2008 33rd IEEE Photovolatic Specialists Conference}, pages={1--4}, author={Haverkamp, Helge and Dastgheib-Shirazi, Amir and Raabe, Bernd and Book, Felix and Hahn, Giso} }
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