Publikation: Influence of low-temperature annealing before firing on LeTID in multicrystalline silicon
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2018
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VERLINDEN, Pierre, ed. and others. 35th European Photovoltaic Solar Energy Conference and Exhibition. München: WIP, 2018, pp. 342-345. ISBN 978-3-936338-50-8
Zusammenfassung
Light and elevated temperature induced degradation (LeTID) affects significantly the performance of multicrystalline silicon (mc-Si) solar cells. Even though the underlying mechanisms of LeTID and subsequent regeneration are still unknown, LeTID formation is known to be influenced by surface passivation, firing, and lowtemperature annealing after firing. Since both the firing peak temperature and the cooling profile strongly influence LeTID, firing is presumed to dominate over any preceding low-temperature steps. However, lifetime measurements during illumination (1.0 ±0.1 suns) at 150°C show a clear difference in the LeTID defect density in samples annealed at 200-500°C before aluminum oxide deposition and before firing. Additionally, LeTID becomes worse when the prefiring annealing is performed in an H plasma atmosphere. Therefore, the firing step does not erase the impact of lowtemperature annealing or pre-firing hydrogenation on LeTID. Finally, thinner samples are shown to cause lower initial effective lifetimes (eff) and less LeTID.
Zusammenfassung in einer weiteren Sprache
Fachgebiet (DDC)
530 Physik
Schlagwörter
Annealing, Degradation, Lifetime, Hydrogen, Multicrystalline Silicon, LeTID
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35th European Photovoltaic Solar Energy Conference and Exhibition, 24. Sept. 2018 - 28. Sept. 2018, Brussels
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ISO 690
SCHMID, Andreas, Jeanette LINDROOS, Annika ZUSCHLAG, Daniel SKORKA, Jakob FRITZ, Giso HAHN, 2018. Influence of low-temperature annealing before firing on LeTID in multicrystalline silicon. 35th European Photovoltaic Solar Energy Conference and Exhibition. Brussels, 24. Sept. 2018 - 28. Sept. 2018. In: VERLINDEN, Pierre, ed. and others. 35th European Photovoltaic Solar Energy Conference and Exhibition. München: WIP, 2018, pp. 342-345. ISBN 978-3-936338-50-8BibTex
@inproceedings{Schmid2018Influ-45201,
year={2018},
title={Influence of low-temperature annealing before firing on LeTID in multicrystalline silicon},
url={https://www.eupvsec-planner.com/presentations/c45339/influence_of_low-temperature_annealing_before_firing_on_letid_in_multicrystalline_silicon.htm},
isbn={978-3-936338-50-8},
publisher={WIP},
address={München},
booktitle={35th European Photovoltaic Solar Energy Conference and Exhibition},
pages={342--345},
editor={Verlinden, Pierre},
author={Schmid, Andreas and Lindroos, Jeanette and Zuschlag, Annika and Skorka, Daniel and Fritz, Jakob and Hahn, Giso}
}RDF
<rdf:RDF
xmlns:dcterms="http://purl.org/dc/terms/"
xmlns:dc="http://purl.org/dc/elements/1.1/"
xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#"
xmlns:bibo="http://purl.org/ontology/bibo/"
xmlns:dspace="http://digital-repositories.org/ontologies/dspace/0.1.0#"
xmlns:foaf="http://xmlns.com/foaf/0.1/"
xmlns:void="http://rdfs.org/ns/void#"
xmlns:xsd="http://www.w3.org/2001/XMLSchema#" >
<rdf:Description rdf:about="https://kops.uni-konstanz.de/server/rdf/resource/123456789/45201">
<dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
<dc:creator>Schmid, Andreas</dc:creator>
<dcterms:title>Influence of low-temperature annealing before firing on LeTID in multicrystalline silicon</dcterms:title>
<dc:creator>Hahn, Giso</dc:creator>
<dcterms:hasPart rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/45201/3/Schmid_2-1qn9mmicwi29b6.pdf"/>
<dc:contributor>Schmid, Andreas</dc:contributor>
<dc:creator>Lindroos, Jeanette</dc:creator>
<dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2019-02-25T12:47:44Z</dcterms:available>
<dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2019-02-25T12:47:44Z</dc:date>
<dc:contributor>Lindroos, Jeanette</dc:contributor>
<bibo:uri rdf:resource="https://kops.uni-konstanz.de/handle/123456789/45201"/>
<void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/>
<dc:language>eng</dc:language>
<dspace:hasBitstream rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/45201/3/Schmid_2-1qn9mmicwi29b6.pdf"/>
<dc:creator>Zuschlag, Annika</dc:creator>
<dcterms:issued>2018</dcterms:issued>
<foaf:homepage rdf:resource="http://localhost:8080/"/>
<dc:rights>terms-of-use</dc:rights>
<dcterms:rights rdf:resource="https://rightsstatements.org/page/InC/1.0/"/>
<dc:contributor>Skorka, Daniel</dc:contributor>
<dc:contributor>Hahn, Giso</dc:contributor>
<dc:contributor>Zuschlag, Annika</dc:contributor>
<dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
<dc:creator>Skorka, Daniel</dc:creator>
<dcterms:abstract xml:lang="eng">Light and elevated temperature induced degradation (LeTID) affects significantly the performance of multicrystalline silicon (mc-Si) solar cells. Even though the underlying mechanisms of LeTID and subsequent regeneration are still unknown, LeTID formation is known to be influenced by surface passivation, firing, and lowtemperature annealing after firing. Since both the firing peak temperature and the cooling profile strongly influence LeTID, firing is presumed to dominate over any preceding low-temperature steps. However, lifetime measurements during illumination (1.0 ±0.1 suns) at 150°C show a clear difference in the LeTID defect density in samples annealed at 200-500°C before aluminum oxide deposition and before firing. Additionally, LeTID becomes worse when the prefiring annealing is performed in an H plasma atmosphere. Therefore, the firing step does not erase the impact of lowtemperature annealing or pre-firing hydrogenation on LeTID. Finally, thinner samples are shown to cause lower initial effective lifetimes (eff) and less LeTID.</dcterms:abstract>
<dc:contributor>Fritz, Jakob</dc:contributor>
<dc:creator>Fritz, Jakob</dc:creator>
</rdf:Description>
</rdf:RDF>Interner Vermerk
xmlui.Submission.submit.DescribeStep.inputForms.label.kops_note_fromSubmitter
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2019-02-25
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