Comparison of Methods for Classification of Alzheimer's Disease, Frontotemporal Dementia and Asymptomatic Controls

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Datum
2013
Autor:innen
Wang, Zhijie
Platsch, Günther
Kornhuber, Johannes
Kuwert, Torsten
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Published
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2013 IEEE Nuclear Science Symposium and Medical Imaging Conference (2013 NSS/MIC) : Seoul, South Korea, 27 October - 2 November 2013; [in conjunction with the 20th International Workshop on Room-Temperature Semiconductor X-Ray and Gamma-Ray Detectors (RTSD)] ; 1. Piscataway, NJ: IEEE, 2013, pp. 194-199. IEEE Nuclear Science Symposium. 60. ISBN 978-1-4799-0532-4
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Fachgebiet (DDC)
570 Biowissenschaften, Biologie
Schlagwörter
Single photon emission computed tomography (SPECT), Alzheimer's disease (AD), frontotemporal dementia (FTD), multivariate analysis, dimensionality reduction
Konferenz
2013 IEEE Nuclear Science Symposium and Medical Imaging Conference (2013 NSS/MIC), 27. Okt. 2013 - 2. Nov. 2013, Seoul, South Korea
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Zitieren
ISO 690WANG, Zhijie, Pawel J. MARKIEWICZ, Günther PLATSCH, Johannes KORNHUBER, Torsten KUWERT, Dorit MERHOF, 2013. Comparison of Methods for Classification of Alzheimer's Disease, Frontotemporal Dementia and Asymptomatic Controls. 2013 IEEE Nuclear Science Symposium and Medical Imaging Conference (2013 NSS/MIC). Seoul, South Korea, 27. Okt. 2013 - 2. Nov. 2013. In: 2013 IEEE Nuclear Science Symposium and Medical Imaging Conference (2013 NSS/MIC) : Seoul, South Korea, 27 October - 2 November 2013; [in conjunction with the 20th International Workshop on Room-Temperature Semiconductor X-Ray and Gamma-Ray Detectors (RTSD)] ; 1. Piscataway, NJ: IEEE, 2013, pp. 194-199. IEEE Nuclear Science Symposium. 60. ISBN 978-1-4799-0532-4
BibTex
@inproceedings{Wang2013Compa-42410,
  year={2013},
  title={Comparison of Methods for Classification of Alzheimer's Disease, Frontotemporal Dementia and Asymptomatic Controls},
  number={60},
  isbn={978-1-4799-0532-4},
  publisher={IEEE},
  address={Piscataway, NJ},
  series={IEEE Nuclear Science Symposium},
  booktitle={2013 IEEE Nuclear Science Symposium and Medical Imaging Conference (2013 NSS/MIC) : Seoul, South Korea, 27 October - 2 November 2013; [in conjunction with the 20th International Workshop on Room-Temperature Semiconductor X-Ray and Gamma-Ray Detectors (RTSD)] ; 1},
  pages={194--199},
  author={Wang, Zhijie and Markiewicz, Pawel J. and Platsch, Günther and Kornhuber, Johannes and Kuwert, Torsten and Merhof, Dorit}
}
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