Simulating electromigration in atomic contacts
| dc.contributor.author | Ring, Markus | |
| dc.date.accessioned | 2021-12-10T06:18:59Z | |
| dc.date.available | 2021-12-10T06:18:59Z | |
| dc.date.issued | 2019 | eng |
| dc.description.version | published | eng |
| dc.identifier.ppn | 1780885695 | |
| dc.identifier.uri | https://kops.uni-konstanz.de/handle/123456789/55831 | |
| dc.language.iso | eng | eng |
| dc.rights | terms-of-use | |
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| dc.subject | Nanocontacts, simulation (MD, DFT, NEGF), electromigration, conductance, current-induced forces, semi-classical Langevin equation | eng |
| dc.subject.ddc | 530 | eng |
| dc.title | Simulating electromigration in atomic contacts | eng |
| dc.type | DOCTORAL_THESIS | eng |
| dspace.entity.type | Publication | |
| kops.citation.bibtex | @phdthesis{Ring2019Simul-55831,
year={2019},
title={Simulating electromigration in atomic contacts},
author={Ring, Markus},
address={Konstanz},
school={Universität Konstanz}
} | |
| kops.citation.iso690 | RING, Markus, 2019. Simulating electromigration in atomic contacts [Dissertation]. Konstanz: University of Konstanz | deu |
| kops.citation.iso690 | RING, Markus, 2019. Simulating electromigration in atomic contacts [Dissertation]. Konstanz: University of Konstanz | eng |
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| kops.date.examination | 2019-12-13 | eng |
| kops.date.yearDegreeGranted | 2019 | eng |
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