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Characterization of epitaxial growth of Fe(110) on (11-20) sapphire substrates driven by Mo(110) seed layers

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Characterization_of_epitaxial_growth_of_Fe.pdf
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2001

Autor:innen

May, Ulrich
Calarco, Raffaella
Hauch, Jan O.
Kittur, Harish
Güntherodt, Gernot

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Surface Science. 2001, 489, pp. 144-150. Available under: doi: 10.1016/S0039-6028(01)01172-4

Zusammenfassung

The molecular beam epitaxy (MBE) growth of bcc Fe(110) thin films on an Al2O3(11-20) substrate using Mo(110) seed layers has been investigated. The growth was studied by reflection high energy electron diffraction (RHEED) in reciprocal space as well as by scanning tunneling microscopy in real space. The relative orientation between the lattices of the Fe(110) layer and theAl2O3(11-20) substrate has been identified and has enabled the construction of a model of the in-plane atomic arrangements. Side reflections found in RHEED patterns indicate the formation of ordered relaxation lines along the [100] direction of the Fe(110).

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Fachgebiet (DDC)
530 Physik

Schlagwörter

Reflection high energy electron diffraction (RHEED), molecular beam epitaxy, scanning tunneling microscopy, epitaxy, growth, iron, molybdenum

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ISO 690MAY, Ulrich, Raffaella CALARCO, Jan O. HAUCH, Harish KITTUR, Mikhail FONIN, Ulrich RÜDIGER, Gernot GÜNTHERODT, 2001. Characterization of epitaxial growth of Fe(110) on (11-20) sapphire substrates driven by Mo(110) seed layers. In: Surface Science. 2001, 489, pp. 144-150. Available under: doi: 10.1016/S0039-6028(01)01172-4
BibTex
@article{May2001Chara-4689,
  year={2001},
  doi={10.1016/S0039-6028(01)01172-4},
  title={Characterization of epitaxial growth of Fe(110) on (11-20) sapphire substrates driven by Mo(110) seed layers},
  volume={489},
  journal={Surface Science},
  pages={144--150},
  author={May, Ulrich and Calarco, Raffaella and Hauch, Jan O. and Kittur, Harish and Fonin, Mikhail and Rüdiger, Ulrich and Güntherodt, Gernot}
}
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